Structural mechanics for electromagnetic railguns
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Dynamic Response of Cantilevered Rail Guns Attributed to Projectile/Gun Interaction-Theory
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Cytochrome P450 1 enzyme inhibition and anticancer potential of chromene amides from Amyris plumieri
Badal, S., Williams, S.A., Huang, G., Francis, S., Vendantam, P., Dunbar, O., Jacobs, H., Tzeng, T.J., Gangemi, J., Delgoda, R.
Published in Fitoterapia (01.03.2011)
Published in Fitoterapia (01.03.2011)
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Mechanics of composite rotating machines for pulsed power applications
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Dynamic response of electromagnetic railgun due to projectile movement
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Viscoelastic analysis of composite rotor for pulsed power applications
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Composite Energy Storage Flywheel Design for Fatigue Crack Resistance
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28nm metal-gate high-K CMOS SoC technology for high-performance mobile applications
Yang, S. H., Sheu, J. Y., Ieong, M. K., Chiang, M. H., Yamamoto, T., Liaw, J. J., Chang, S. S., Lin, Y. M., Hsu, T. L., Hwang, J. R., Ting, J. K., Wu, C. H., Ting, K. C., Yang, F. C., Liu, C. M., Wu, I. L., Chen, Y. M., Chent, S. J., Chen, K. S., Cheng, J. Y., Tsai, M. H., Chang, W., Chen, R., Chen, C. C., Lee, T. L., Lin, C. K., Yang, S. C., Sheu, Y. M., Tzeng, J. T., Lu, L. C., Jang, S. M., Diaz, C. H., Mii, Y.
Published in 2011 IEEE Custom Integrated Circuits Conference (CICC) (01.09.2011)
Published in 2011 IEEE Custom Integrated Circuits Conference (CICC) (01.09.2011)
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Investigation of Hot Carrier Degradation Modes in LDMOS by using a Novel Three-Region Charge Pumping Technique
Cheng, C.C., Tu, K.C., Tahui Wang, Hsieh, T.S., Tzeng, J.T., Jong, Y.C., Liou, R.S., Pan, S.C., Hsu, S.L.
Published in 2006 IEEE International Reliability Physics Symposium Proceedings (01.01.2006)
Published in 2006 IEEE International Reliability Physics Symposium Proceedings (01.01.2006)
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Physics and Characterization of Various Hot-Carrier Degradation Modes in LDMOS by Using a Three-Region Charge-Pumping Technique
Chih-Chang Cheng, Lin, J.F., Tahui Wang, Hsieh, T.H., Tzeng, J.T., Jong, Y.C., Liou, R.S., Pan, S.C., Hsu, S.L.
Published in IEEE transactions on device and materials reliability (01.09.2006)
Published in IEEE transactions on device and materials reliability (01.09.2006)
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Magazine Article
Optimization processing unit (OPU) applied to integrated circuit design and manufacturing
Chen, Don C. L., Tzeng, J. T., Scott, David B., Peng, S. W., Shen, M. H., Sio, K. T., Narayanasetti, Praneeth
Published in 2013 IEEE International Conference on Automation Science and Engineering (CASE) (01.08.2013)
Published in 2013 IEEE International Conference on Automation Science and Engineering (CASE) (01.08.2013)
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Impact of Self-Heating Effect on Hot Carrier Degradation in High-Voltage LDMOS
Chih-Chang Cheng, Lin, J.F., Tahui Wang
Published in 2007 IEEE International Electron Devices Meeting (01.01.2007)
Published in 2007 IEEE International Electron Devices Meeting (01.01.2007)
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