Modeling mutually exclusive events in fault trees
Twigg, D.W., Ramesh, A.V., Sandadi, U.R., Sharma, T.C.
Published in Annual Reliability and Maintainability Symposium. 2000 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.00CH37055) (2000)
Published in Annual Reliability and Maintainability Symposium. 2000 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.00CH37055) (2000)
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