Analysis on Copper Photocorrosion Induced by Illuminance in Chemical Mechanical Planarization Equipment Using Photodiode and Quartz Crystal Microbalance
Shima, Shohei, Wada, Yutaka, Tokushige, Katsuhiko, Fukunaga, Akira, Tsujimura, Manabu
Published in Japanese Journal of Applied Physics (01.05.2010)
Published in Japanese Journal of Applied Physics (01.05.2010)
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Journal Article
Paradigm Cliff 2020 - The future of semi-conductor device and CMP technologies
Tsujimura, Manabu
Published in Proceedings of International Conference on Planarization/CMP Technology 2014 (01.11.2014)
Published in Proceedings of International Conference on Planarization/CMP Technology 2014 (01.11.2014)
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Conference Proceeding