Effective channel length estimation using charge-based capacitance measurement
Tsuji, K., Terada, K.
Published in 2013 IEEE International Conference on Microelectronic Test Structures (ICMTS) (01.03.2013)
Published in 2013 IEEE International Conference on Microelectronic Test Structures (ICMTS) (01.03.2013)
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Conference Proceeding
Effective channel length of MOSFET with halo
Terada, Kazuo, Sanai, Kazuhiko, Matsuoka, Shouhei, Tsuji, Katsuhiro
Published in Proceedings of 2013 International Conference on IC Design & Technology (ICICDT) (01.05.2013)
Published in Proceedings of 2013 International Conference on IC Design & Technology (ICICDT) (01.05.2013)
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Conference Proceeding
Reconsideration of the threshold voltage variability estimated with pair transistor cell array
Terada, K., Higuchi, N., Tsuji, K.
Published in 2013 IEEE International Conference on Microelectronic Test Structures (ICMTS) (01.03.2013)
Published in 2013 IEEE International Conference on Microelectronic Test Structures (ICMTS) (01.03.2013)
Get full text
Conference Proceeding