ESD and Latchup Optimization of an Embedded-Floating-pMOS SCR-Incorporated BJT
Chih-Yao, Huang, Fu-Chien, Chiu, Chien-Min Ou, Chen, Quo-Ker, Yi-Jou, Huang, Jen-Chou Tseng
Published in IEEE transactions on electron devices (01.08.2016)
Published in IEEE transactions on electron devices (01.08.2016)
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Journal Article
Improving ESD robustness of stacked diodes with embedded SCR for RF applications in 65-nm CMOS
Chun-Yu Lin, Mei-Lian Fan, Ming-Dou Ker, Li-Wei Chu, Jen-Chou Tseng, Ming-Hsiang Song
Published in 2014 IEEE International Reliability Physics Symposium (01.06.2014)
Published in 2014 IEEE International Reliability Physics Symposium (01.06.2014)
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Conference Proceeding
ESD protection design for wideband RF applications in 65-nm CMOS process
Li-Wei Chu, Chun-Yu Lin, Ming-Dou Ker, Ming-Hsiang Song, Jen-Chou Tseng, Chewn-Pu Jou, Ming-Hsien Tsai
Published in 2014 IEEE International Symposium on Circuits and Systems (ISCAS) (01.06.2014)
Published in 2014 IEEE International Symposium on Circuits and Systems (ISCAS) (01.06.2014)
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Conference Proceeding
Compact and low-loss ESD protection design for V-band RF applications in a 65-nm CMOS technology
Li-Wei Chu, Chun-Yu Lin, Shiang-Yu Tsai, Ming-Dou Ker, Ming-Hsiang Song, Chewn-Pu Jou, Tse-Hua Lu, Jen-Chou Tseng, Ming-Hsien Tsai, Tsun-Lai Hsu, Ping-Fang Hung, Tzu-Heng Chang
Published in 2012 IEEE International Symposium on Circuits and Systems (ISCAS) (01.05.2012)
Published in 2012 IEEE International Symposium on Circuits and Systems (ISCAS) (01.05.2012)
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Conference Proceeding
A 6.5kV ESD-protected low noise amplifier in 65-nm CMOS
Ming-Hsien Tsai, Fu-Lung Hsueh, Chewn-Pu Jou, Ming-Hsiang Song, Jen-Chou Tseng, Hsu, Shawn S H, Sean Chen
Published in 2010 IEEE MTT-S International Microwave Symposium (01.05.2010)
Published in 2010 IEEE MTT-S International Microwave Symposium (01.05.2010)
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Conference Proceeding
Mechanism of snapback failure induced by the latch-up test in high-voltage CMOS integrated circuits
Jen-Chou Tseng, Yu-Lin Chen, Chung-Ti Hsu, Fu-Yi Tsai, Po-An Chen, Ming-Dou Ker
Published in 2008 IEEE International Reliability Physics Symposium (01.04.2008)
Published in 2008 IEEE International Reliability Physics Symposium (01.04.2008)
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Conference Proceeding
An on-chip combo clamp for surge and universal ESD protection in bulk FinFET technology
Ming-Fu Tsai, Jen-Chou Tseng, Chung-Yu Huang, Tzu-Heng Chang, Kuo-Ji Chen, Ming-Hsiang Song
Published in 2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2016)
Published in 2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2016)
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Conference Proceeding
Investigation and solution to the early failure of parasitic NPN triggered by the adjacent PNP ESD clamps
Ming-Fu Tsai, Jen-Chou Tseng, Kuo-Ji Chen, Ming-Hsiang Song
Published in 2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2015)
Published in 2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2015)
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Conference Proceeding
A high latchup - Immune ESD protection SCR-incorporated BJT in deep submicron technology
Chih-Yao Huang, Fu-Chien Chiu, Ji-Fan Chi, Yi-Jou Huang, Quo-Ker Chen, Jen-Chou Tseng
Published in Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2013)
Published in Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2013)
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Conference Proceeding
ESD protection design for radio-frequency integrated circuits in nanoscale CMOS technology
Lin, Chun-Yu, Chu, Li-Wei, Tsai, Shiang-Yu, Ker, Ming-Dou, Song, Ming-Hsiang, Jou, Chewn-Pu, Lu, Tse-Hua, Tseng, Jen-Chou, Tsai, Ming-Hsien, Hsu, Tsun-Lai, Hung, Ping-Fang, Wei, Yu-Lin, Chang, Tzu-Heng
Published in 2013 13th IEEE International Conference on Nanotechnology (IEEE-NANO 2013) (01.08.2013)
Published in 2013 13th IEEE International Conference on Nanotechnology (IEEE-NANO 2013) (01.08.2013)
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Conference Proceeding
Journal Article
ESD protection structure with inductor-triggered SCR for RF applications in 65-nm CMOS process
Chun-Yu Lin, Li-Wei Chu, Ming-Dou Ker, Ming-Hsiang Song, Chewn-Pu Jou, Tse-Hua Lu, Jen-Chou Tseng, Ming-Hsien Tsai, Tsun-Lai Hsu, Ping-Fang Hung, Tzu-Heng Chang
Published in 2012 IEEE International Reliability Physics Symposium (IRPS) (01.04.2012)
Published in 2012 IEEE International Reliability Physics Symposium (IRPS) (01.04.2012)
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Conference Proceeding
An ultra-low power K-band low-noise amplifier co-designed with ESD protection in 40-nm CMOS
Ming-Hsien Tsai, Hsu, S S H, Fu-Lung Hsueh, Chewn-Pu Jou, Tzu-Jin Yeh, Ming-Hsiang Song, Jen-Chou Tseng
Published in 2011 IEEE International Conference on IC Design & Technology (01.05.2011)
Published in 2011 IEEE International Conference on IC Design & Technology (01.05.2011)
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Conference Proceeding