Functionally Complete Boolean Logic in 1T1R Resistive Random Access Memory
Zhuo-Rui Wang, Yu-Ting Su, Yi Li, Ya-Xiong Zhou, Tian-Jian Chu, Kuan-Chang Chang, Ting-Chang Chang, Tsung-Ming Tsai, Sze, Simon M., Xiang-Shui Miao
Published in IEEE electron device letters (01.02.2017)
Published in IEEE electron device letters (01.02.2017)
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Journal Article
Investigation Between Recover Behavior and Defect With Variation of Light Source in AlGaN/GaN HEMTs After Hot-Carrier Stress
Sun, Li-Chuan, Lin, Shih-Kai, Yeh, Yu-Hsuan, Tu, Yu-Fa, Tan, Yung-Fang, Zhou, Kuan-Ju, Tsai, Tsung-Ming, Chang, Ting-Chang
Published in IEEE electron device letters (01.04.2023)
Published in IEEE electron device letters (01.04.2023)
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Journal Article
Physical and chemical mechanisms in oxide-based resistance random access memory
Chang, Kuan-Chang, Chang, Ting-Chang, Tsai, Tsung-Ming, Zhang, Rui, Hung, Ya-Chi, Syu, Yong-En, Chang, Yao-Feng, Chen, Min-Chen, Chu, Tian-Jian, Chen, Hsin-Lu, Pan, Chih-Hung, Shih, Chih-Cheng, Zheng, Jin-Cheng, Sze, Simon M
Published in Nanoscale research letters (12.03.2015)
Published in Nanoscale research letters (12.03.2015)
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Journal Article
Degradation Behavior of Etch-Stopper-Layer Structured a-InGaZnO Thin-Film Transistors Under Hot-Carrier Stress and Illumination
Lin, Dong, Su, Wan-Ching, Chang, Ting-Chang, Chen, Hong-Chih, Tu, Yu-Fa, Zhou, Kuan-Ju, Hung, Yang-Hao, Yang, Jianwen, Lu, I-Nien, Tsai, Tsung-Ming, Zhang, Qun
Published in IEEE transactions on electron devices (01.02.2021)
Published in IEEE transactions on electron devices (01.02.2021)
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Journal Article
Impact of Variant Gate Insulator Fabrication Process on Reliability of Dual-Gate InGaZnO Thin-Film Transistors
Chien, Ya-Ting, Zhou, Kuan-Ju, Tai, Mao-Chou, Chen, Yu-An, Sun, Pei-Jun, Lee, Ya-Huan, Chang, Ting-Chang, Tsai, Tsung-Ming, Fan, Yang-Shun, Huang, Chen-Shuo, Chen, Kuo-Kuang, Tsai, Chih-Hung
Published in IEEE transactions on electron devices (01.03.2023)
Published in IEEE transactions on electron devices (01.03.2023)
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Journal Article
Analysis of Negative Bias Temperature Instability Degradation in p-Type Low-Temperature Polycrystalline Silicon Thin-Film Transistors of Different Grain Sizes
Tu, Hong-Yi, Tsai, Tsung-Ming, Wu, Chia-Chuan, Tsao, Yu-Ching, Tai, Mao-Chou, Chang, Ting-Chang, Tsai, Yu-Lin, Huang, Shin-Ping, Zheng, Yu-Zhe, Wang, Yu-Xuan, Chen, Hong-Chih
Published in IEEE electron device letters (01.11.2019)
Published in IEEE electron device letters (01.11.2019)
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Journal Article
Effects of Redundant Electrode Width on Stability of a-InGaZnO Thin-Film Transistors Under Hot-Carrier Stress
Lin, Dong, Su, Wan-Ching, Chang, Ting-Chang, Chen, Hong-Chih, Tu, Yu-Fa, Yang, Jianwen, Zhou, Kuan-Ju, Hung, Yang-Hao, Lu, I-Nien, Tsai, Tsung-Ming, Zhang, Qun
Published in IEEE transactions on electron devices (01.06.2020)
Published in IEEE transactions on electron devices (01.06.2020)
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Journal Article
Increasing Controllable Oxygen Ions to Improve Device Performance Using Supercritical Fluid Technique in ZnO-Based Resistive Random Access Memory
Chou, Sheng-Yao, Yang, Chih-Cheng, Chang, Ting-Chang, Tsai, Tsung-Ming, Lin, Shih-Kai, Kuo, Chan-Wei, Wu, Chung-Wei, Wang, Yu-Bo, Sze, Simon M.
Published in IEEE transactions on electron devices (01.01.2022)
Published in IEEE transactions on electron devices (01.01.2022)
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Journal Article
Performance Enhancement of InGaZnO Top-Gate Thin Film Transistor With Low-Temperature High-Pressure Fluorine Treatment
Chien, Ya-Ting, Tsai, Yu-Lin, Zhou, Kuan-Ju, Zheng, Yu-Zhe, Tai, Mao-Chou, Tu, Hong-Yi, Kuo, Chuan-Wei, Chang, Ting-Chang, Tsai, Tsung-Ming
Published in IEEE electron device letters (01.11.2021)
Published in IEEE electron device letters (01.11.2021)
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Journal Article
Improvement of Resistive Switching Characteristics in Zinc Oxide-Based Resistive Random Access Memory by Ammoniation Annealing
Wu, Pei-Yu, Zheng, Hao-Xuan, Shih, Chih-Cheng, Chang, Ting-Chang, Chen, Wei-Jang, Yang, Chih-Cheng, Chen, Wen-Chung, Tai, Mao-Chou, Tan, Yung-Fang, Huang, Hui-Chun, Ma, Xiao-Hua, Hao, Yue, Tsai, Tsung-Ming, Sze, Simon M.
Published in IEEE electron device letters (01.03.2020)
Published in IEEE electron device letters (01.03.2020)
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Journal Article
A Method to Measure Polarization Signal of Nanoscale One-Transistor-One-Capacitor Ferroelectric Memory
Chang, Kai-Chun, Chen, Po-Hsun, Chang, Ting-Chang, Tan, Yung-Fang, Chen, Wen-Chung, Yeh, Chien-Hung, Ciou, Fong-Min, Tai, Mao-Chou, Tsai, Tsung-Ming, Sze, Simon
Published in IEEE electron device letters (01.06.2022)
Published in IEEE electron device letters (01.06.2022)
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Journal Article
Investigation of the Self-Heating Effect in High Performance Organic TFTs With Multi-Finger Structure
Chen, Yu-An, Zheng, Yu-Zhe, Chang, Ting-Chang, Zhou, Kuan-Ju, Sun, Pei-Jun, Hung, Yang-Hao, Lee, Ya-Huan, Tsai, Tsung-Ming, Chen, Jin-Wei, Kuo, Chuan-Wei, Tsai, Chia-Hung, Ogier, Simon
Published in IEEE electron device letters (01.08.2022)
Published in IEEE electron device letters (01.08.2022)
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Journal Article
Performance Improvement by Enhancing Passivation Layer of p-Type GaN High-Electron Mobility Transistors With Supercritical Oxygen Treatment
Chou, Sheng-Yao, Wu, Pei-Yu, Chen, Ming-Chen, Chang, Ting-Chang, Tsai, Xin-Ying, Lin, Shih-Kai, Kuo, Ting-Tzu, Huang, Wei-Chen, Tu, Hong-Yi, Wu, Chung-Wei, Tsai, Tsung-Ming, Huang, Jen-Wei
Published in IEEE electron device letters (01.02.2023)
Published in IEEE electron device letters (01.02.2023)
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Journal Article
Hydrogen as a Cause of Abnormal Subchannel Formation Under Positive Bias Temperature Stress in a-InGaZnO Thin-Film Transistors
Chien, Yu-Chieh, Yang, Yi-Chieh, Tsao, Yu-Ching, Chiang, Hsiao-Cheng, Tai, Mao-Chou, Tsai, Yu-Lin, Chen, Po-Hsun, Tsai, Tsung-Ming, Chang, Ting-Chang
Published in IEEE transactions on electron devices (01.07.2019)
Published in IEEE transactions on electron devices (01.07.2019)
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Journal Article
Bulk Oxygen-Ion Storage in Indium-Tin-Oxide Electrode for Improved Performance of HfO2-Based Resistive Random Access Memory
Po-Hsun Chen, Kuan-Chang Chang, Ting-Chang Chang, Tsung-Ming Tsai, Chih-Hung Pan, Tian-Jian Chu, Min-Chen Chen, Hui-Chun Huang, Ikai Lo, Jin-Cheng Zheng, Sze, Simon M.
Published in IEEE electron device letters (01.03.2016)
Published in IEEE electron device letters (01.03.2016)
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Journal Article
A solid-state semiconductor battery with silica-coated TiO2 core–shell energy storage nanoparticles for rechargeable device application
Wang, Min-Chuan, Wu, Bo-Hsien, Liu, Shang-En, Li, Yu-Chen, Lin, Shih-Kai, Tsai, Tsung-Ming, Chang, Ting-Chang
Published in AIP advances (01.09.2023)
Published in AIP advances (01.09.2023)
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Journal Article
Performance and Reliability Optimization of Supercritical-Nitridation-Treated AlGaN/GaN High-Electron-Mobility Transistors
Wu, Pei-Yu, Chang, Ting-Chang, Chen, Ming-Chen, Zheng, Hao-Xuan, Lin, Yu-Shan, Tsai, Xin-Ying, Chang, Kuo-Jen, Kuo, Wei-Cheng, Lin, Chao-Wei, Liu, Guan-Shian, Tsai, Tsung-Ming
Published in IEEE transactions on electron devices (01.09.2021)
Published in IEEE transactions on electron devices (01.09.2021)
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Journal Article
Abnormal Two-Stage Degradation on P-Type Low-Temperature Polycrystalline-Silicon Thin-Film Transistor Under Hot Carrier Conditions
Tu, Hong-Yi, Chang, Ting-Chang, Tsao, Yu-Ching, Tai, Mao-Chou, Zheng, Yu-Zhe, Tu, Yu-Fa, Kuo, Chuan-Wei, Wu, Chia-Chuan, Tsai, Yu-Lin, Tsai, Tsung-Ming, Lin, Chih-Chih, Chien, Ya-Ting
Published in IEEE electron device letters (01.05.2022)
Published in IEEE electron device letters (01.05.2022)
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Journal Article
Enhancing Reliability and 2 mm-Axial Mechanical Bending Endurance by Gate Insulator Improvements in Flexible Polycrystalline Silicon TFTs
Zheng, Yu-Zhe, Chen, Po-Hsun, Chang, Ting-Chang, Tsai, Tsung-Ming, Zhou, Kuan-Ju, Tu, Yu-Fa, Wang, Yu-Xuan, Wu, Chia-Chuan, Chen, Yu-An, Sun, Pei-Jun, Chen, Juan-Jie, Tu, Hong-Yi, Hung, Yang-Hao, Lin, Yu-Shan, Ciou, Fong-Min, Shih, Yu-Shan, Huang, Hui-Chun
Published in IEEE transactions on electron devices (01.05.2022)
Published in IEEE transactions on electron devices (01.05.2022)
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Journal Article
Rational Hydrogenation for Enhanced Mobility and High Reliability on ZnO-based Thin Film Transistors: From Simulation to Experiment
Xu, Lei, Chen, Qian, Liao, Lei, Liu, Xingqiang, Chang, Ting-Chang, Chang, Kuan-Chang, Tsai, Tsung-Ming, Jiang, Changzhong, Wang, Jinlan, Li, Jinchai
Published in ACS applied materials & interfaces (02.03.2016)
Published in ACS applied materials & interfaces (02.03.2016)
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