Assimilation of radar‐derived refractivity and radar data in the context of ensemble Kalman filter: Cases study of the Southwest Monsoon Experiment
Do, Phuong‐Nghi, Chung, Kao‐Shen, Feng, Ya‐Chien, Lin, Pay‐Liam, Tsai, Bo‐An
Published in Quarterly journal of the Royal Meteorological Society (01.04.2023)
Published in Quarterly journal of the Royal Meteorological Society (01.04.2023)
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Journal Article
EMMI Abnormal Hotspot Study for Latch up Simulation
Chia-Sheng, Huang, Xuan-Chao, Guo, Zhi-Wei, Chen, shin-chia, Lin, Sheng-Ru, Zhang, Bo-an, Tsai
Published in 2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2019)
Published in 2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2019)
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Conference Proceeding
Case Study For STI-LDNMOS Burned During HCI Stress to Passing Reliability Specifications
Chu, Wei-Cheng, Tsai, Bo-An, Yoshida, Hiroshi, Chen, Yi-Heng, Hsu, Yung-Lung
Published in 2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (18.07.2022)
Published in 2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (18.07.2022)
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Conference Proceeding
Low-temperature microwave annealing processes for future IC fabrication
Yao-Jen Lee, Bo-An Tsai, Ta-Chun Cho, Fu-Kuo Hsueh, Po-Jung Sung, Chiung-Hui Lai, Chih-Wei Luo, Tien-Sheng Chao
Published in 2014 IEEE International Nanoelectronics Conference (INEC) (01.07.2014)
Published in 2014 IEEE International Nanoelectronics Conference (INEC) (01.07.2014)
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Conference Proceeding
Using Spike-Anneal to Reduce Interfacial Layer Thickness and Leakage Current in Metal–Oxide–Semiconductor Devices with TaN/Atomic Layer Deposition-Grown HfAlO/Chemical Oxide/Si Structure
Tsai, Bo-An, Lee, Yao-Jen, Peng, Hsin-Yi, Tzeng, Pei-Jer, Luo, Chih-wei, Chang-Liao, Kuei-Shu
Published in Japanese Journal of Applied Physics (01.04.2008)
Published in Japanese Journal of Applied Physics (01.04.2008)
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Journal Article
Physical Mechanism for Different Phases and Turn-Around of Idsat in PMOS under HCI Stress
Tsai, Bo-An, Chu, Wei-Cheng, Chang, Yu-Chih, Chen, Yi-Heng, Chen, Chien-Fu
Published in 2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (15.09.2021)
Published in 2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (15.09.2021)
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Conference Proceeding
Electrical failure analysis using SEM Automated Process Inspection (API) System
Chen, Yu-Chi, Lee, Shih-Ping, Tsai, Bo-An, Chan, Chun-I
Published in 2019 Joint International Symposium on e-Manufacturing & Design Collaboration(eMDC) & Semiconductor Manufacturing (ISSM) (01.09.2019)
Published in 2019 Joint International Symposium on e-Manufacturing & Design Collaboration(eMDC) & Semiconductor Manufacturing (ISSM) (01.09.2019)
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Conference Proceeding
Analysis for the Physical Mechanism of the Abnormal Increase of Idsat in NMOS under HCI
Chu, Wei-Cheng, Tsai, Bo-An, Chen, Cheng-Te, Chang, Chi-Li, Lin, Wei-Fong
Published in 2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (15.09.2021)
Published in 2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (15.09.2021)
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Conference Proceeding
HIGH ELECTRON MOBILITY TRANSISTOR DEVICE AND MANUFACTURING METHOD THEREOF
Yeh, Po-Hsien, Mu, Zheng-Chang, Lu, Chih-Hung, Tsai, Bo-An, Hwang, Robin Christine, Chou, Jih-Wen
Year of Publication 07.03.2024
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Year of Publication 07.03.2024
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