A technology development SRAM approach with DFM considerations
Craig, M., Deshazo, D., Prior, S., Tranchina, B., Erhart, M., Mahant-Shetti, S.S., Taylor, R., Xing, Y., Quek, E., Chok, K.L., Kamat, N., Redford, M.
Published in 2000 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop. ASMC 2000 (Cat. No.00CH37072) (2000)
Published in 2000 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop. ASMC 2000 (Cat. No.00CH37072) (2000)
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Conference Proceeding
Test structure and method for capacitance extraction in multi-conductor systems
Ward, B., Bordelon, J., Prior, S., Tranchina, B., Jiann Liu
Published in ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153) (2001)
Published in ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153) (2001)
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Conference Proceeding
A strategy for mixed-signal yield improvement
Bordelon, J., Tranchina, B., Madangarli, V., Craig, M.
Published in IEEE design & test of computers (01.05.2002)
Published in IEEE design & test of computers (01.05.2002)
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Journal Article
Resistor matching characterization for process development using D/A converter
Katakam, S., Tranchina, B., Bordelon, J., Ramaswamy, A., Wooyoung Choi, Chu, S.
Published in ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153) (2001)
Published in ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153) (2001)
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Conference Proceeding
A robust and production worthy addressable array architecture for deep sub-micron MOSFET's matching characterization
Yeo, S.B., Bordelon, J., Chu, S., Li, M.F., Tranchina, B.A., Harward, M., Chan, L.H., See, A.
Published in Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002. ICMTS 2002 (2002)
Published in Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002. ICMTS 2002 (2002)
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Conference Proceeding
Technology development SRAM approach with DFM considerations
Craig, M, Deshazo, D, Prior, S, Tranchina, B, Erhart, M, Mahant-Shetti, S S, Taylor, R, Xing, Y, Quek, E, Chok, K L, Kamat, N, Redford, M
Published in IEEE International Symposium on Semiconductor Manufacturing conference proceedings (01.01.2000)
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Published in IEEE International Symposium on Semiconductor Manufacturing conference proceedings (01.01.2000)
Journal Article
A strategy for mixed-signal yield improvement
Bordelon, Jim, Tranchina, Ben, Madangarli, Vipin, Craig, Mark
Published in IEEE design & test of computers (01.05.2002)
Get full text
Published in IEEE design & test of computers (01.05.2002)
Journal Article