by Craig, M., Deshazo, D., Prior, S., Tranchina, B., Erhart, M., Mahant-Shetti, S.S., Taylor, R., Xing, Y., Quek, E., Chok, K.L., Kamat, N., Redford, M.
Published in 2000 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop. ASMC 2000 (Cat. No.00CH37072) (2000)

by Ward, B., Bordelon, J., Prior, S., Tranchina, B., Jiann Liu
Published in ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153) (2001)

by Bordelon, J., Tranchina, B., Madangarli, V., Craig, M.
Published in IEEE design & test of computers (01.05.2002)

by Katakam, S., Tranchina, B., Bordelon, J., Ramaswamy, A., Wooyoung Choi, Chu, S.
Published in ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153) (2001)

by Yeo, S.B., Bordelon, J., Chu, S., Li, M.F., Tranchina, B.A., Harward, M., Chan, L.H., See, A.
Published in Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002. ICMTS 2002 (2002)

by Craig, M, Deshazo, D, Prior, S, Tranchina, B, Erhart, M, Mahant-Shetti, S S, Taylor, R, Xing, Y, Quek, E, Chok, K L, Kamat, N, Redford, M
Published in IEEE International Symposium on Semiconductor Manufacturing conference proceedings (01.01.2000)

by TRANCHINA B
Year of Publication 24.06.1981

by Bordelon, Jim, Tranchina, Ben, Madangarli, Vipin, Craig, Mark
Published in IEEE design & test of computers (01.05.2002)