Experimental Measurements of Constriction Resistance for Electrical Contacts Simulated Using Microfabrication
Fukuyama, Yasuhiro, Sakamoto, Norihiko, Kondo, Takaya, Toyoizumi, Jun, Yudate, Takahiro, Kaneko, Nobu-Hisa
Published in IEEE transactions on components, packaging, and manufacturing technology (2011) (01.06.2018)
Published in IEEE transactions on components, packaging, and manufacturing technology (2011) (01.06.2018)
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Journal Article
ELECTRICAL CONNECTION DEGRADATION DIAGNOSING DEVICE AND DEGRADATION DIAGNOSING METHOD
TOYOIZUMI JUN, ITO YOSHITAKA, KANEKO NOBUHISA, KONDO TAKAYA, FUKUYAMA YASUHIRO
Year of Publication 09.01.2020
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Year of Publication 09.01.2020
Patent