Cell-Aware ATPG to Improve Defect Coverage for FPGA IPs and Next Generation Zynq® MPSoCs
Potluri, Seetal, Mathew, Aaron, Nerukonda, Rambabu, Hartanto, Ismed, Toutounchi, Shahin
Published in 2017 IEEE 26th Asian Test Symposium (ATS) (01.11.2017)
Published in 2017 IEEE 26th Asian Test Symposium (ATS) (01.11.2017)
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Conference Proceeding
Fault grading FPGA interconnect test configurations
Tahoori, M.B., Mitra, S., Toutounchi, S., McCluskey, E.J.
Published in Proceedings - International Test Conference (2002)
Published in Proceedings - International Test Conference (2002)
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Conference Proceeding
FPGA bridging fault detection and location via differential IDDQ
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Conference Proceeding
Testing of a programmable device
Wells, Robert W, Bapat, Shekhar, Payakapan, Tassanee, Toutounchi, Shahin
Year of Publication 25.05.2010
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Year of Publication 25.05.2010
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