Trench insulated gate bipolar transistors submitted to high temperature bias stress
Maïga, C.O., Toutah, H., Tala-Ighil, B., Boudart, B.
Published in Microelectronics and reliability (01.09.2005)
Published in Microelectronics and reliability (01.09.2005)
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Journal Article
Conference Proceeding
Comparison Between the Behaviour of Punch-Through and Non-Punch-Through Insulated Gate Bipolar Transistors Under High Temperature Reverse Bias Stress
MAIGA, C. O, TOUTAH, H, TALA-IGHIL, B, BOUDART, B
Published in Microelectronics and reliability (01.09.2004)
Published in Microelectronics and reliability (01.09.2004)
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Journal Article
Conference Proceeding
State creation under gate-bias stress in polysilicon TFTs studied from the temperature-transfer characteristics behavior
Toutah, H., Llibre, J.F., Tala-Ighil, B., Boudart, B., Mohammed-Brahim, T.
Published in Thin solid films (03.03.2003)
Published in Thin solid films (03.03.2003)
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Journal Article
Conference Proceeding
Study of the stability of polycrystalline silicon by means of the behavior of thin film transistors under gate bias stress
Mohammed-Brahim, T., Rahal, A., Gautier, G., Raoult, F., Toutah, H., Tala-Ighil, B., Llibre, J.F.
Published in Journal of non-crystalline solids (01.04.2002)
Published in Journal of non-crystalline solids (01.04.2002)
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Journal Article
Stability of unhydrogenated polysilicon thin film transistors and structural quality of the channel material
Toutah, H., Tala-Ighil, B., Llibre, J.F., Rahal, A., Mourgues, K., Helen, Y., Mohammed-Brahim, T., Dassow, R., Köhler, J.R.
Published in Thin solid films (15.02.2001)
Published in Thin solid films (15.02.2001)
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Journal Article
Conference Proceeding
Improved stability of large area excimer laser crystallised polysilicon Thin Film Transistors under DC and AC operating
Toutah, H, Llibre, J F, Tala-Ighil, B, Mohammed-Brahim, T, Helen, Y, Gautier, G, Bonnaud, O
Published in Microelectronics and reliability (01.09.2001)
Published in Microelectronics and reliability (01.09.2001)
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Journal Article
Stability of polysilicon thin film transistors under switch operating
Toutah, H., Llibre, J.F., Tala-Ighil, B., Mohammed-Brahim, T., Mourgues, K., Helen, Y., Raoult, F., Bonnaud, O.
Published in Microelectronics and reliability (01.08.2000)
Published in Microelectronics and reliability (01.08.2000)
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Journal Article
Gate bias stress in hydrogenated and unhydrogenated polysilicon thin film transistors
Tala-Ighil, B., Toutah, H., Rahal, A., Mourgues, K., Pichon, L., Raoult, F., Bonnaud, O., Mohammed-Brahim, T.
Published in Microelectronics and reliability (01.06.1998)
Published in Microelectronics and reliability (01.06.1998)
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Journal Article
Conference Proceeding
Reliability of TFTs
Toutah, H., Llibre, Jean-François, Mohammed-Brahim, Tayeb, Bonnaud, Olivier
Published in Microelectronics and reliability (01.09.2003)
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Published in Microelectronics and reliability (01.09.2003)
Journal Article
Study of the stability of polycristalline silicon by means of the behavior of thin film transistors under gate bias stress
Mohammed-Brahim, Tayeb, Rahal, A., Gautier, G., Raoult, F., Toutah, H., Tala-Ighil, B., Llibre, Jean-François
Published in Journal of non-crystalline solids (01.04.2002)
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Published in Journal of non-crystalline solids (01.04.2002)
Journal Article
Improved Stability of Large Area Excimer Laser Crstallised Polysilicon Thin Film Transistors under DC and AC Operating
Toutah, H., Llibre, J.F., Tala-Ighil, B., Mohammed-Brahim, T., Helen, Y., Gautier, G., Bonnaud, O.
Published in Microelectronics and reliability (01.09.2001)
Published in Microelectronics and reliability (01.09.2001)
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Journal Article
Study of the stability of polycrystalline silicon by means of the behavior of thin film transistors under gate bias stress
MOHAMMED-BRAHIM, T, RAHAL, A, GAUTIER, G, RAOULT, F, TOUTAH, H, TALA-IGHIL, B, LLIBRE, J. F
Published in Journal of non-crystalline solids (2002)
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Published in Journal of non-crystalline solids (2002)
Conference Proceeding
Non-punch-through insulated gate bipolar transistors under high temperature gate bias and high temperature reverse bias stresses-hard-switching performances evolution
Maiga, C.O., Tala-Ighil, B., Toutah, H., Boudart, B.
Published in 2005 European Conference on Power Electronics and Applications (2005)
Published in 2005 European Conference on Power Electronics and Applications (2005)
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Conference Proceeding