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OOMORI, Kenzou, FUKASAWA, Mikiko, TOMITA, Takayuki, KOGURE, Takeshi, MATSUI, Toshiki, FUKUDA, Yuuki
Year of Publication 03.10.2024
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Year of Publication 03.10.2024
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A model for the intrinsic breakdown in thin gate oxides
Tomita, Takayuki, Utunomiya, Hiroto, Taniguchi, Kenzi, Kamakura, Yoshinari
Published in The Journal of Reliability Engineering Association of Japan (10.06.1997)
Published in The Journal of Reliability Engineering Association of Japan (10.06.1997)
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MATSUI TOSHIKI, FUKUDA YUKI, KOGURE TAKESHI, FUKASAWA, MIKIKO, TOMITA TAKAYUKI, OMORI KENZO
Year of Publication 06.08.2024
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Year of Publication 06.08.2024
Patent