Search Results - "TOKIDA RURIKO" :: K.UTB vyhledávací portál

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METHOD AND DEVICE FOR ANALYZING COMPOSITE MATERIAL STRUCTURE, AND PROGRAM THEREOF

by TOKIDA RURIKO
Year of Publication 21.11.2023

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COMPOSITE MATERIAL TEXTURE ANALYSIS METHOD AND ANALYZER, AND PROGRAM THEREFOR

by TOKIDA RURIKO
Year of Publication 09.02.2023

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THERMAL ANALYSIS DATA PROCESSING DEVICE AND THERMAL ANALYSIS DATA PROCESSING METHOD

by KITAGAWA ISAO, TOKIDA RURIKO
Year of Publication 09.06.2023

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ANALYSIS METHOD AND ANALYSIS SYSTEM OF MATERIAL ORGANIZATION

by SHIGEMOTO YASUTAKA, TOKIDA RURIKO
Year of Publication 09.02.2023

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MATERIAL COMPOSITION ANALYZING METHOD AND ANALYZING SYSTEM

by YAMAMOTO HIROYUKI, TOKIDA RURIKO
Year of Publication 19.12.2019

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METHOD FOR ANALYZING POLYCRYSTALLINE MATERIAL

by YAMAMOTO HIROYUKI, TOKIDA RURIKO
Year of Publication 31.01.2019

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CHARGED PARTICLE BEAM MICROSCOPE, SAMPLE HOLDER FOR CHARGED PARTICLE BEAM MICROSCOPE, AND CHARGED PARTICLE BEAM MICROSCOPY METHOD

by KASHIMA HIDEO, KIKUCHI HIDEKI, TOKIDA RURIKO
Year of Publication 01.08.2013

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SAMPLE EVALUATION DEVICE AND METHOD

by TAKAGUCHI MASANARI, TOKIDA RURIKO
Year of Publication 23.08.2007

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DARK FIELD SCANNING TRANSMISSION ELECTRON MICROSCOPE AND OBSERVATION METHOD

by TAKAGUCHI MASANARI, TOKIDA RURIKO
Year of Publication 02.09.2005

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FLAW INSPECTION DEVICE AND POSITIVE ELECTRON BEAM APPLICATION DEVICE

by TAKAGUCHI MASANARI, TOKIDA RURIKO
Year of Publication 02.12.2004

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SAMPLE HOLDER AND SAMPLE ANALYZER USING THE SAME

by TAKAGUCHI MASANARI, TOKIDA RURIKO, ONO SHIANO
Year of Publication 25.02.2010

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ELECTRON MICROSCOPE

by MATSUMOTO TAKAO, TAKAGUCHI MASANARI, TOKIDA RURIKO
Year of Publication 24.07.2008

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CHARGED PARTICLE BEAM MICROSCOPIC METHOD, AND CHARGED PARTICLE BEAM DEVICE

by TAKAGUCHI MASANARI, INADA HIROMI, TOKIDA RURIKO
Year of Publication 24.01.2008

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PRE-SHRINK SHAPE ESTIMATION METHOD AND CD-SEM APPARATUS

by OMORI KIYOKO, TEI TOMOKI, KAWADA HIROKI, OHASHI KENYOSHI, SEKIGUCHI TOMOKO, TANAKA JUNICHI, TOKIDA RURIKO
Year of Publication 04.03.2013

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SAMPLE ANALYZER AND SAMPLE ANALYZING METHOD

by TAKAGUCHI MASANARI, TOKIDA RURIKO, ONO SHIANO
Year of Publication 22.11.2007

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Patent

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DESIGNATED POSITION IDENTIFICATION METHOD AND DESIGNATED POSITION MEASURING DEVICE

by AZUMA JUNZO, TOKIDA RURIKO, ANDO TORU
Year of Publication 08.11.2007

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METHOD FOR ANALYZING MISALIGNMENT BETWEEN IMAGES

by KAKIBAYASHI HIROSHI, TOKIDA RURIKO
Year of Publication 22.12.1998

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SAMPLE MAKING APPARATUS FOR THREE-DIMENSIONAL STRUCTURE OBSERVATION, ELECTRON MICROSCOPE, AND ITS METHOD

by KAKIBAYASHI HIROSHI, TAKAGUCHI MASANARI, NAKAMURA KUNIYASU, TOKIDA RURIKO
Year of Publication 04.06.2009

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CHARGED PARTICLE BEAM MICROSCOPE SYSTEM AND MICROSCOPIC DETECTION METHOD

by YAGUCHI NORIE, KIKUCHI HIDEKI, TOKIDA RURIKO, YOTSUTSUJI TAKAFUMI
Year of Publication 21.05.2009

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ELECTRON MICROSCOPE FOR MEASUREMENT OF COMPOSITION AND LATTICE DISTORTION AND OBSERVATION WITH IT

by KAKIBAYASHI HIROSHI, TOKIDA RURIKO
Year of Publication 22.04.1997

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Patent

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