Direct observation of molecular alignment in an intense laser field by pulsed gas electron diffraction I: observation of anisotropic diffraction image
Hoshina, Kennosuke, Yamanouchi, Kaoru, Ohshima, Takashi, Ose, Yoichi, Todokoro, Hideo
Published in Chemical physics letters (13.02.2002)
Published in Chemical physics letters (13.02.2002)
Get full text
Journal Article
Direct observation of molecular alignment in an intense laser field by pulsed gas electron diffraction II: analysis of anisotropic diffraction image
Hoshina, Kennosuke, Yamanouchi, Kaoru, Ohshima, Takashi, Ose, Yoichi, Todokoro, Hideo
Published in Chemical physics letters (13.02.2002)
Published in Chemical physics letters (13.02.2002)
Get full text
Journal Article
CHARGED PARTICLE BEAM DEVICE
TANIMOTO NORIFUMI, DOI TAKASHI, MATSUNAGA SOICHIRO, TODOKORO HIDEO, KAWANO HAJIME, ISHIKAWA SHUHEI, KATAGIRI SOUICHI, KASUYA KEIGO
Year of Publication 26.03.2020
Get full text
Year of Publication 26.03.2020
Patent
CHARGED PARTICLE BEAM APPARATUS, AND METHOD OF CONTROLLING THE SAME
TODOKORO HIDEO, KOKUBO SHIGERU, KATAGIRI SOUICHI, KASUYA KEIGO, OSHIMA TAKU
Year of Publication 30.03.2017
Get full text
Year of Publication 30.03.2017
Patent
Role of Ion Bombardment in Field Emission Current Instability
Todokoro, Hideo, Saitou, Norio, Yamamoto, Shigehiko
Published in Japanese Journal of Applied Physics (01.01.1982)
Published in Japanese Journal of Applied Physics (01.01.1982)
Get full text
Journal Article
CHARGED PARTICLE BEAM APPARATUS, AND METHOD OF CONTROLLING THE SAME
TODOKORO HIDEO, KOKUBO SHIGERU, KATAGIRI SOUICHI, KASUYA KEIGO, OSHIMA TAKU
Year of Publication 25.12.2014
Get full text
Year of Publication 25.12.2014
Patent
Spin-polarized scanning electron microscopy
KOIKE, K, MATSUYAMA, H, TODOKORO, H, HAYAKAWA, K
Published in Japanese Journal of Applied Physics (01.08.1985)
Published in Japanese Journal of Applied Physics (01.08.1985)
Get full text
Journal Article
Spin-polarized scanning electron microscope for magnetic domain observation
KOIKE, K, MATSUYAMA, H, TODOKORO, H, HAYAKAWA, K
Published in Japanese Journal of Applied Physics (01.07.1985)
Published in Japanese Journal of Applied Physics (01.07.1985)
Get full text
Journal Article
High spatial resolution spin-polarized scanning electron microscope
KOIKE, K, MATSUYAMA, H, TODOKORO, H, HAYAKAWA, K
Published in Japanese Journal of Applied Physics (01.10.1985)
Published in Japanese Journal of Applied Physics (01.10.1985)
Get full text
Journal Article
CHARGED PARTICLE BEAM APPARATUS, AND METHOD OF CONTROLLING THE SAME
KOKUBO, SHIGERU, KATAGIRI, SOUICHI, TODOKORO, HIDEO, KASUYA, KEIGO, OHSHIMA, TAKASHI
Year of Publication 23.12.2009
Get full text
Year of Publication 23.12.2009
Patent
ELECTRON BEAM SOURCE, AND ELECTRON-BEAM APPLICATION DEVICE
FUJIEDA, TADASHI, HAYASHIBARA, MITSUO, TODOKORO, HIDEO, OHSHIMA, TAKASHI, HIDAKA, KISHIO
Year of Publication 29.12.2005
Get full text
Year of Publication 29.12.2005
Patent