Characterisation of Ge nanocrystals in co-sputtered Ge+SiO2 system using raman spectroscopy, RBS and TEM
HO, Y. W, NG, V, CHOI, W. K, NG, S. P, OSIPOWICZ, T, SENG, H. L, TJUI, W. W, LI, K
Published in Scripta materialia (18.05.2001)
Published in Scripta materialia (18.05.2001)
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