Search Results - "TIEMEIJER, Peter Christiaan" :: K.UTB vyhledávací portál | TBU Library Retrieval Portal

EELS EELS DETECTION TECHNIQUE IN AN ELECTRON MICROSCOPE

EELS EELS DETECTION TECHNIQUE IN AN ELECTRON MICROSCOPE

by KUIJPER MAARTEN, MCCORMACK JAMIE, FREITAG BERT HENNING, LAZAR SORIN, VEEN GERARD NICOLAAS ANNE VAN, TIEMEIJER PETER CHRISTIAAN, KUJAWA STEPHAN
Year of Publication 12.11.2019

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Patent

GUN LENS DESIGN IN A CHARGED PARTICLE MICROSCOPE

GUN LENS DESIGN IN A CHARGED PARTICLE MICROSCOPE

by GHEIDARI ALI MOHAMMADI, DONA PLEUN, LIU KUN, SCHWIND GREGORY A, VAN DE WATER GERBERT JEROEN, BISCHOFF MAARTEN, TIEMEIJER PETER CHRISTIAAN, HENSTRA ALEXANDER
Year of Publication 13.11.2018

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Patent

TRANSMISSION CHARGED PARTICLE MICROSCOPE WITH AN ELECTRON ENERGY LOSS SPECTROSCOPY DETECTOR

TRANSMISSION CHARGED PARTICLE MICROSCOPE WITH AN ELECTRON ENERGY LOSS SPECTROSCOPY DETECTOR

by Tiemeijer, Peter Christiaan
Year of Publication 01.08.2024

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Patent

Transmission charged particle microscope with an electron energy loss spectroscopy detector

Transmission charged particle microscope with an electron energy loss spectroscopy detector

by Tiemeijer, Peter Christiaan
Year of Publication 09.04.2024

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Patent

Method of determining an energy width of a charged particle beam

Method of determining an energy width of a charged particle beam

by Tiemeijer, Peter Christiaan
Year of Publication 02.04.2024

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Patent

EELS Auto-Alignment Using Full Image Simulation

EELS Auto-Alignment Using Full Image Simulation

by HENSTRA, Alexander, TIEMEIJER, Peter Christiaan
Year of Publication 13.06.2024

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Patent

METHOD OF DETERMINING AN ENERGY WIDTH OF A CHARGED PARTICLE BEAM

METHOD OF DETERMINING AN ENERGY WIDTH OF A CHARGED PARTICLE BEAM

by Tiemeijer, Peter Christiaan
Year of Publication 25.05.2022

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Patent

METHOD OF DETERMINING AN ENERGY WIDTH OF A CHARGED PARTICLE BEAM

METHOD OF DETERMINING AN ENERGY WIDTH OF A CHARGED PARTICLE BEAM

by Tiemeijer, Peter Christiaan
Year of Publication 12.05.2022

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Patent

TRANSMISSION CHARGED PARTICLE MICROSCOPE WITH IMPROVED EELS/EFTEM MODULE

TRANSMISSION CHARGED PARTICLE MICROSCOPE WITH IMPROVED EELS/EFTEM MODULE

by Henstra, Alexander, Tiemeijer, Peter Christiaan
Year of Publication 01.11.2023

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Patent

TRANSMISSION CHARGED PARTICLE MICROSCOPE WITH AN ELECTRON ENERGY LOSS SPECTROSCOPY DETECTOR

TRANSMISSION CHARGED PARTICLE MICROSCOPE WITH AN ELECTRON ENERGY LOSS SPECTROSCOPY DETECTOR

by Tiemeijer, Peter Christiaan
Year of Publication 06.10.2021

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Patent

TRANSMISSION CHARGED PARTICLE MICROSCOPE WITH AN ELECTRON ENERGY LOSS SPECTROSCOPY DETECTOR

TRANSMISSION CHARGED PARTICLE MICROSCOPE WITH AN ELECTRON ENERGY LOSS SPECTROSCOPY DETECTOR

by Tiemeijer, Peter Christiaan
Year of Publication 30.09.2021

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Patent

Transmission charged particle microscope with adjustable beam energy spread

Transmission charged particle microscope with adjustable beam energy spread

by Tiemeijer, Peter Christiaan
Year of Publication 01.06.2021

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Patent

Method and system to determine crystal structure

Method and system to determine crystal structure

by Buijsse, Bart, Raaijmakers, Hans, Tiemeijer, Peter Christiaan
Year of Publication 21.05.2024

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Patent

TRANSMISSION CHARGED PARTICLE MICROSCOPE WITH ADJUSTABLE BEAM ENERGY SPREAD

TRANSMISSION CHARGED PARTICLE MICROSCOPE WITH ADJUSTABLE BEAM ENERGY SPREAD

by Tiemeijer, Peter Christiaan
Year of Publication 08.07.2020

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Patent

Electron energy loss spectroscopy with adjustable energy resolution

Electron energy loss spectroscopy with adjustable energy resolution

by Tiemeijer, Peter Christiaan
Year of Publication 31.12.2019

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Patent

TRANSMISSION CHARGED PARTICLE MICROSCOPE WITH ADJUSTABLE BEAM ENERGY SPREAD

TRANSMISSION CHARGED PARTICLE MICROSCOPE WITH ADJUSTABLE BEAM ENERGY SPREAD

by Tiemeijer, Peter Christiaan
Year of Publication 12.12.2019

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Patent

ELECTRON ENERGY LOSS SPECTROSCOPY WITH ADJUSTABLE ENERGY RESOLUTION

ELECTRON ENERGY LOSS SPECTROSCOPY WITH ADJUSTABLE ENERGY RESOLUTION

by TIEMEIJER, Peter Christiaan
Year of Publication 10.10.2019

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Patent

Detectors For Microscopy

Detectors For Microscopy

by Mele, Luigi, van Veen, Gerard Nicolaas Anne, Tiemeijer, Peter Christiaan
Year of Publication 18.07.2024

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Patent

IMPROVED DETECTORS FOR MICROSCOPY

IMPROVED DETECTORS FOR MICROSCOPY

by ANNE VAN VEEN, Gerard Nicolaas, MELE, Luigi, TIEMEIJER, Peter Christiaan
Year of Publication 10.07.2024

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Patent

IMPROVED DETECTORS FOR MICROSCOPY

IMPROVED DETECTORS FOR MICROSCOPY

by ANNE VAN VEEN, Gerard Nicolaas, MELE, Luigi, TIEMEIJER, Peter Christiaan
Year of Publication 03.07.2024

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Patent

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