RF capacitance-voltage characterization of MOSFETs with high leakage dielectrics
Schmitz, J., Cubaynes, F.N., Havens, R.J., de Kort, R., Scholten, A.J., Tiemeijer, L.F.
Published in IEEE electron device letters (01.01.2003)
Published in IEEE electron device letters (01.01.2003)
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Journal Article
The impact of an aluminum top layer on inductors integrated in an advanced CMOS copper backend
Tiemeijer, L.F., Havens, R.J., Bouttement, Y., Pranger, H.J.
Published in IEEE electron device letters (01.11.2004)
Published in IEEE electron device letters (01.11.2004)
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Journal Article
Record Q symmetrical inductors for 10-GHz LC-VCOs in 0.18-μm gate-length CMOS
Tiemeijer, L.F., Havens, R.J., Pavlovic, N., Leenaerts, D.M.W.
Published in IEEE electron device letters (01.12.2002)
Published in IEEE electron device letters (01.12.2002)
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Journal Article
The RF-CV method for characterization of leaky gate dielectrics
Schmitz, J., Cubaynes, F.N., de Kort, R., Havens, R., Scholten, A.J., Tiemeijer, L.F.
Published in Microelectronic engineering (01.04.2004)
Published in Microelectronic engineering (01.04.2004)
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Journal Article
Conference Proceeding
Numerical modeling of RF noise in scaled MOS devices
Jungemann, C., Neinhüs, B., Nguyen, C.D., Scholten, A.J., Tiemeijer, L.F., Meinerzhagen, B.
Published in Solid-state electronics (2006)
Published in Solid-state electronics (2006)
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Journal Article
Conference Proceeding
Noise modeling for RF CMOS circuit simulation
Scholten, A.J., Tiemeijer, L.F., van Langevelde, R., Havens, R.J., Zegers-van Duijnhoven, A.T.A., Venezia, V.C.
Published in IEEE transactions on electron devices (01.03.2003)
Published in IEEE transactions on electron devices (01.03.2003)
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Journal Article
Comparison of the "pad-open-short" and "open-short-load" deembedding techniques for accurate on-wafer RF characterization of high-quality passives
Tiemeijer, L.F., Havens, R.J., Jansman, A.B.M., Bouttement, Y.
Published in IEEE transactions on microwave theory and techniques (01.02.2005)
Published in IEEE transactions on microwave theory and techniques (01.02.2005)
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Journal Article
RF-CMOS performance trends
Woerlee, P.H., Knitel, M.J., van Langevelde, R., Klaassen, D.B.M., Tiemeijer, L.F., Scholten, A.J., Zegers-van Duijnhoven, A.T.A.
Published in IEEE transactions on electron devices (01.08.2001)
Published in IEEE transactions on electron devices (01.08.2001)
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Journal Article
Improved Y-factor method for wide-band on-wafer noise-parameter measurements
Tiemeijer, L.F., Havens, R.J., de Kort, R., Scholten, A.J.
Published in IEEE transactions on microwave theory and techniques (01.09.2005)
Published in IEEE transactions on microwave theory and techniques (01.09.2005)
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Journal Article
High-output-power (+15 dBm) unidirectional 1310-nm multiple-quantum-well booster amplifier module
Tiemeijer, L.F., Thijs, P.J.A., Van Dongen, T., Binsma, J.J.M., Jansen, E.J., Kuindersma, P.I., Cuijpers, G.P.J.M., Walczyk, S.
Published in IEEE photonics technology letters (01.12.1995)
Published in IEEE photonics technology letters (01.12.1995)
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Journal Article
Temperature dependence of a 1300 nm polarization-insensitive multiple quantum well laser amplifier and its implications for the ultimate capacity of cascaded amplifier systems
Tiemeijer, L.F., Thijs, P.J.A., Dongen, T.V., Binsma, J.J.M., Jansen, E.J.
Published in IEEE photonics technology letters (01.11.1994)
Published in IEEE photonics technology letters (01.11.1994)
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Journal Article
High-gain 1310 nm semiconductor optical amplifier modules with a built-in amplified signal monitor for optical gain control
Tiemeijer, L.F., Walczyk, S., Verboven, A.J.M., van den Hoven, G.N., Thijs, P.J.A., van Dongen, T., Binsma, J.J.M., Jansen, E.J.
Published in IEEE photonics technology letters (01.03.1997)
Published in IEEE photonics technology letters (01.03.1997)
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Journal Article