by Krautschneider, W.H., Kohlhase, A., Terletzki, H.
Published in Microelectronics Reliability (1997)

by Terletzki, H., Nikutta, W., Reczek, W.
Published in I.E.E.E. transactions on electron devices (01.11.1993)

by Qiuyi Ye, Terletzki, H., Tonti, W.
Published in 2000 IEEE International Integrated Reliability Workshop Final Report (Cat. No.00TH8515) (2000)

by Terletzki, H, Nikutta, W, Reczek, W
Published in IEEE transactions on electron devices (01.11.1993)

by Kirihata, T., Mueller, G., Ji, B., Frankowsky, G., Ross, J.M., Terletzki, H., Netis, D.G., Weinfurtner, O., Hanson, D.R., Daniel, G., Hsu, L.L.-C., Sotraska, D.W., Reith, A.M., Hug, M.A., Guay, K.P., Selz, M., Poechmueller, P., Hoenigschmid, H., Wordeman, M.R.
Published in IEEE journal of solid-state circuits (01.11.1999)

by Kirihata, T, Mueller, G, Clinton, M, Loeffler, S, Ji, B, Terletzki, H, Hanson, D, Hwang, C-L, Lehmann, G, Storaska, D, Daniel, G, Hsu, L, Weinfurtner, O, Boehler, T, Schnell, J
Published in Digest of technical papers - IEEE International Solid-State Circuits Conference (01.01.2001)

by Hoenigschmid, H, Frey, A, DeBrosse, J.K, Kirihata, T, Mueller, G, Storaska, D.W, Daniel, G, Frankowsky, G, Guay, K.P, Hanson, D.R, Hsu, L.L.-C, Ji, B, Netis, D.G, Panaroni, S, Radens, C, Reith, A.M, Terletzki, H, Weinfurtner, O, Alsmeier, J, Weber, W, Wordeman, M.R
Published in IEEE journal of solid-state circuits (01.05.2000)

by Hoenigschmid, H., Frey, A., DeBrosse, J.K., Kirihata, T., Mueller, G., Storaska, D.W., Daniel, G., Frankowsky, G., Guay, K.P., Hanson, D.R., Hsu, L.L.-C., Ji, B., Netis, D.G., Panaroni, S., Radens, C., Reith, A.M., Terletzki, H., Weinfurtner, O., Alsmeier, J., Weber, W., Wordeman, M.R.
Published in IEEE journal of solid-state circuits (01.05.2000)

by Hoenigschmid, H, Frey, A, DeBrosse, J K, Kirihata, T, Mueller, G, Storaska, D W, Daniel, G, Frankowsky, G, Guay, K P, Hanson, D R, Hsu, L L-C, Ji, B, Netis, D G, Panaroni, S, Radens, C, Reith, A M, Terletzki, H, Weinfurtner, O, Alsmeier, J
Published in IEEE journal of solid-state circuits (01.05.2000)

by Hoenigschmid, H, Frey, A, DeBrosse, J K, Kirihata, T, Mueller, G, Storaska, D W, Daniel, G, Frankowsky, G, Guay, K P, Hanson, DR, Hsu, LL-C, Ji, B, Netis, D G, Panaroni, S, Radens, C, Reith, A M, Terletzki, H, Weinfurtner, O, Alsmeier, J, Weber, W, Wordeman, M R
Published in IEEE journal of solid-state circuits (01.01.2000)

by Kirihata, T., Gall, M., Hosokawa, K., Dortu, J.-M., Hing Wong, Pfefferi, P., Ji, B.L., Weinfurtner, O., DeBrosse, J.K., Terletzki, H., Selz, M., Ellis, W., Wordeman, M.R., Kiehl, O.
Published in IEEE journal of solid-state circuits (01.11.1998)

by Kirihata, T, Gall, M, Hosokawa, K, Dortu, J-M, Wong, Hing, Pfefferi, P, Ji, B L, Weinfurtner, O, DeBrosse, J K, Terletzki, H, Selz, M, Ellis, W, Wordeman, M R, Kiehl, O
Published in IEEE journal of solid-state circuits (01.11.1998)

by Kirihata, T, Mueller, G, Ji, B, Frankowsky, G, Ross, J M, Terletzki, H, Netis, D G, Weinfurtner, O, Hanson, D R, Daniel, G, Hsu, L L-C, Sotraska, D W, Reith, A M, Hug, M A, Guay, K P, Selz, M, Poechmueller, P, Hoenigschmid, H, Wordeman, M R
Published in IEEE journal of solid-state circuits (01.11.1999)

by KRAUTSCHNEIDER, W. H, TERLETZKI, H, QIN WANG
Published in Microelectronics and reliability (1992)

by Kirihata, T, Mueller, G, Ji, B, Frankowsky, G, Ross, J M, Terletzki, H, Netis, D G, Weinfurtner, O, Hanson, DR, Daniel, G, Hsu, LL-C, Sotraska, D W, Reith, A M, Hug, MA, Guay, K P, Selz, M, Poechmueller, P, Hoenigschmid, H, Wordeman, M R
Published in IEEE journal of solid-state circuits (01.01.1999)

by Kirihata, T, Gall, M, Hosokawa, K, Dortu, J-M, Wong, H, Pfefferl, K-P, Ji, B, Weinfurtner, O, DeBrosse, J, Terletzki, H, Selz, M, Ellis, W, Wordeman, M, Kiehl, O
Published in Digest of technical papers - IEEE International Solid-State Circuits Conference (01.01.1998)

by Krautschneider, Wolfgang H., Terletzki, Hartmud, Wang, Qin
Published in Microelectronics and reliability (01.11.1992)

by Terletzki, H., Risch, L.
Published in Proceedings of the 1989 International Conference on Microelectronic Test Structures (1989)

by Kirihata, T., Mueller, G., Clinton, M., Loeffler, S., Ji, B., Terletzki, H., Hanson, D., Chorng-Lil Hwang, Lehmann, G., Storaska, D., Daniel, G., Hsu, L., Weinfurtner, O., Boehler, T., Schnell, J., Frankowsky, G., Netis, D., Ross, J., Reith, A., Kiehl, O., Wordeman, M.
Published in 2001 IEEE International Solid-State Circuits Conference. Digest of Technical Papers. ISSCC (Cat. No.01CH37177) (2001)

by Kirihata, T., Mueller, G., Ji, B., Frankowsky, G., Ross, J., Terletzki, H., Netis, D., Weinfurtner, O., Hanson, D., Daniel, G., Hsu, L., Storaska, D., Reith, A., Hug, M., Guay, K., Selz, M., Poechmueller, P., Hoenigschmid, H., Wordeman, M.
Published in 1999 IEEE International Solid-State Circuits Conference. Digest of Technical Papers. ISSCC. First Edition (Cat. No.99CH36278) (1999)