Controlled oxide interlayer for improving reliability of SiO2/GaN MOS devices
Yamada, Takahiro, Terashima, Daiki, Nozaki, Mikito, Yamada, Hisashi, Takahashi, Tokio, Shimizu, Mitsuaki, Yoshigoe, Akitaka, Hosoi, Takuji, Shimura, Takayoshi, Watanabe, Heiji
Published in Japanese Journal of Applied Physics (01.06.2019)
Published in Japanese Journal of Applied Physics (01.06.2019)
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Journal Article
Evaluation and mitigation of reactive ion etching-induced damage in AlGaN/GaN MOS structures fabricated by low-power inductively coupled plasma
Nozaki, Mikito, Terashima, Daiki, Yoshigoe, Akitaka, Hosoi, Takuji, Shimura, Takayoshi, Watanabe, Heiji
Published in Japanese Journal of Applied Physics (01.07.2020)
Published in Japanese Journal of Applied Physics (01.07.2020)
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Journal Article
SiO2/AlON stacked gate dielectrics for AlGaN/GaN MOS heterojunction field-effect transistors
Watanabe, Kenta, Terashima, Daiki, Nozaki, Mikito, Yamada, Takahiro, Nakazawa, Satoshi, Ishida, Masahiro, Anda, Yoshiharu, Ueda, Tetsuzo, Yoshigoe, Akitaka, Hosoi, Takuji, Shimura, Takayoshi, Watanabe, Heiji
Published in Japanese Journal of Applied Physics (01.06.2018)
Published in Japanese Journal of Applied Physics (01.06.2018)
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Journal Article
Influences of Intensity of Electric Field on Properties of Poly(vinylidene fluoride--tetrafluoroethylene) Thin Films during Annealing Process
Jeong, Jong-Hyeon, Terashima, Daiki, Kimura, Chiharu, Aoki, Hidemitsu
Published in Japanese Journal of Applied Physics (01.04.2011)
Published in Japanese Journal of Applied Physics (01.04.2011)
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Journal Article
Influences of Intensity of Electric Field on Properties of Poly(vinylidene fluoride–tetrafluoroethylene) Thin Films during Annealing Process
Jeong, Jong-Hyeon, Terashima, Daiki, Kimura, Chiharu, Aoki, Hidemitsu
Published in Japanese Journal of Applied Physics (01.04.2011)
Published in Japanese Journal of Applied Physics (01.04.2011)
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Journal Article
CONTROL DEVICE, POWER CONVERSION DEVICE, AND AC CAPACITOR FAILURE DETECTION METHOD
TERASHIMA, Daiki, FUKASAWA, Issei, KATSUKURA, Tomoya, TAWADA, Yoshihiro
Year of Publication 06.04.2023
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Year of Publication 06.04.2023
Patent
CONTROL DEVICE, POWER CONVERSION DEVICE, AND MALFUNCTION DETECTION METHOD FOR AC CAPACITOR
TERASHIMA, Daiki, FUKASAWA, Issei, KATSUKURA, Tomoya, TAWADA, Yoshihiro
Year of Publication 29.12.2022
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Year of Publication 29.12.2022
Patent
Comparative study on thermal robustness of GaN and AlGaN/GaN MOS devices with thin oxide interlayers
Nozaki, Mikito, Terashima, Daiki, Yamada, Takahiro, Yoshigoe, Akitaka, Hosoi, Takuji, Shimura, Takayoshi, Watanabe, Heiji
Published in Japanese Journal of Applied Physics (01.06.2019)
Published in Japanese Journal of Applied Physics (01.06.2019)
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Journal Article
VOLTAGE DETECTION UNIT AND WIRE ARRANGEMENT SYSTEM
YANAGIHARA SHINICHI, TERASHIMA DAIKI, MORISAKU NAOTO, OKAZAKI YUTARO, MORIOKA REISHI, UEDA HIROMI
Year of Publication 25.10.2023
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Year of Publication 25.10.2023
Patent