A reliability-aware RF power amplifier design for CMOS radio chip integration
Ruberto, M., Degani, O., Wail, S., Tendler, A., Fridman, A., Goltman, G.
Published in 2008 IEEE International Reliability Physics Symposium (01.04.2008)
Published in 2008 IEEE International Reliability Physics Symposium (01.04.2008)
Get full text
Conference Proceeding