Analysis of molecular monolayers adsorbed on metal surfaces by glow discharge optical emission spectrometry
Molchan, Igor S, Thompson, George E, Skeldon, Peter, Licciardello, Antonino, Tuccitto, Nunzio, Tempez, Agnes
Published in Journal of analytical atomic spectrometry (01.01.2013)
Published in Journal of analytical atomic spectrometry (01.01.2013)
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Journal Article
Nanometer‐Scale Uniform Conductance Switching in Molecular Memristors
Goswami, Sreetosh, Deb, Debalina, Tempez, Agnès, Chaigneau, Marc, Rath, Santi Prasad, Lal, Manohar, Ariando, Williams, R. Stanley, Goswami, Sreebrata, Venkatesan, Thirumalai
Published in Advanced materials (Weinheim) (01.10.2020)
Published in Advanced materials (Weinheim) (01.10.2020)
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Journal Article
Ga-grading and Solar Cell Capacitance Simulation of an industrial Cu(In,Ga)Se2 solar cell produced by an in-line vacuum, all-sputtering process
Bras, Patrice, Frisk, Christopher, Tempez, Agnès, Niemi, Esko, Platzer-Björkman, Charlotte
Published in Thin solid films (31.08.2017)
Published in Thin solid films (31.08.2017)
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Journal Article
Molybdenum Disulfide Nanoribbons with Enhanced Edge Nonlinear Response and Photoresponsivity
Ghimire, Ganesh, Ulaganathan, Rajesh Kumar, Tempez, Agnès, Ilchenko, Oleksii, Unocic, Raymond R., Heske, Julian, Miakota, Denys I., Xiang, Cheng, Chaigneau, Marc, Booth, Tim, Bøggild, Peter, Thygesen, Kristian S., Geohegan, David B., Canulescu, Stela
Published in Advanced materials (Weinheim) (01.08.2023)
Published in Advanced materials (Weinheim) (01.08.2023)
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Journal Article
Improved interface and electrical properties of atomic layer deposited Al2O3/4H-SiC
Suvanam, Sethu Saveda, Usman, Muhammed, Martin, David, Yazdi, Milad. G., Linnarsson, Margareta, Tempez, Agnès, Götelid, Mats, Hallén, Anders
Published in Applied surface science (01.03.2018)
Published in Applied surface science (01.03.2018)
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Journal Article
Spatially-Localized Functionalization on Nanostructured Surfaces for Enhanced Plasmonic Sensing Efficacy
Bryche, Jean-François, Vega, Marlo, Tempez, Agnès, Brulé, Thibault, Carlier, Thomas, Moreau, Julien, Chaigneau, Marc, Charette, Paul G., Canva, Michael
Published in Nanomaterials (Basel, Switzerland) (01.10.2022)
Published in Nanomaterials (Basel, Switzerland) (01.10.2022)
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Journal Article
Crystallographic properties and elemental migration in two-stage prepared CuIn1−xAlxSe2 thin films for photovoltaic applications
Aninat, Rémi, Zoppi, Guillaume, Tempez, Agnès, Chapon, Patrick, Beattie, Neil S., Miles, Robert, Forbes, Ian
Published in Journal of alloys and compounds (25.07.2013)
Published in Journal of alloys and compounds (25.07.2013)
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Journal Article
Pulsed radiofrequency glow discharge time-of-flight mass spectrometry for molecular depth profiling of polymer-based films
Tuccitto, Nunzio, Lobo, Lara, Tempez, Agnès, Delfanti, Ivan, Chapon, Patrick, Canulescu, Stela, Bordel, Nerea, Michler, Johann, Licciardello, Antonino
Published in Rapid communications in mass spectrometry (15.03.2009)
Published in Rapid communications in mass spectrometry (15.03.2009)
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Journal Article
Doping silica beyond limits with laser plasma for active photonic materials
Chandrappan, Jayakrishnan, Murray, Matthew, Petrik, Peter, Agocs, Emil, Zolnai, Zsolt, Tempez, Agnès, Legendre, Sébastien, Steenson, D. P., Jha, Animesh, Jose, Gin
Published in Optical materials express (01.12.2015)
Published in Optical materials express (01.12.2015)
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Journal Article
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Nolot, Emmanuel, Mazel, Yann, Barnes, Jean‐Paul, Sabbione, Chiara, Navarro, Gabriele, Tempez, Agnes, Legendre, Sébastien
Published in Surface and interface analysis (01.12.2020)
Published in Surface and interface analysis (01.12.2020)
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Journal Article
Cover Image
Nolot, Emmanuel, Mazel, Yann, Barnes, Jean‐Paul, Sabbione, Chiara, Navarro, Gabriele, Tempez, Agnes, Legendre, Sébastien
Published in Surface and interface analysis (01.12.2020)
Published in Surface and interface analysis (01.12.2020)
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Journal Article
Cover Image
Nolot, Emmanuel, Mazel, Yann, Jean‐Paul Barnes, Sabbione, Chiara, Navarro, Gabriele, Tempez, Agnes, Legendre, Sébastien
Published in Surface and interface analysis (01.12.2020)
Published in Surface and interface analysis (01.12.2020)
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Journal Article
Accelerating the development of phase‐change random access memory with in‐fab plasma profiling time‐of‐flight mass spectrometry
Nolot, Emmanuel, Mazel, Yann, Barnes, Jean‐Paul, Sabbione, Chiara, Navarro, Gabriele, Tempez, Agnes, Legendre, Sébastien
Published in Surface and interface analysis (01.12.2020)
Published in Surface and interface analysis (01.12.2020)
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Journal Article
The Aun cluster probe in secondary ion mass spectrometry: influence of the projectile size and energy on the desorption/ionization rate from biomolecular solids
Novikov, Alexey, Caroff, Martine, Della-Negra, Serge, Depauw, Joël, Fallavier, Mireille, Le Beyec, Yvon, Pautrat, Michèle, Schultz, J. Albert, Tempez, Agnès, Woods, Amina S.
Published in Rapid communications in mass spectrometry (15.07.2005)
Published in Rapid communications in mass spectrometry (15.07.2005)
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Journal Article
Orthogonal time-of-flight secondary ion mass spectrometric analysis of peptides using large gold clusters as primary ions
Tempez, Agnès, Schultz, J. A., Della-Negra, S., Depauw, J., Jacquet, D., Novikov, A., Lebeyec, Y., Pautrat, M., Caroff, M., Ugarov, M., Bensaoula, H., Gonin, M., Fuhrer, K., Woods, Amina
Published in Rapid communications in mass spectrometry (01.01.2004)
Published in Rapid communications in mass spectrometry (01.01.2004)
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Journal Article
Crystallographic properties and elemental migration in two-stage prepared CuIn(1-x)Al(x)Se(2) thin films for photovoltaic applications
Aninat, Remi, Zoppi, Guillaume, Tempez, Agnes, Chapon, Patrick, Beattie, Neil S, Miles, Robert, bes, Ian
Published in Journal of alloys and compounds (25.07.2013)
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Published in Journal of alloys and compounds (25.07.2013)
Journal Article
Rapid, semi-quantitative depth profiling of ultra-thin films using plasma profiling time-of-flight mass spectrometry: AM: Advanced metrology
Mazel, Yann, Barnes, Jean-Paul, Nolot, Emmanuel, Tempez, Agnes, Legendre, Sebastien
Published in 2017 28th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.05.2017)
Published in 2017 28th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.05.2017)
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Conference Proceeding
Detection of negative ions in glow discharge mass spectrometry for analysis of solid specimens
Canulescu, Stela, Molchan, Igor S., Tauziede, C., Tempez, Agnes, Whitby, J. A., Thompson, George E., Skeldon, Peter, Chapon, P., Michler, Johann
Published in Analytical and bioanalytical chemistry (01.04.2010)
Published in Analytical and bioanalytical chemistry (01.04.2010)
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Journal Article