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SET-Induced Dropout and Recovery of Cross-Coupled and Differential-Colpitts Microwave Oscillators Using SiGe HBTs
Teng, Jeffrey W., Mensah, Yaw A., Brumbach, Zachary R., Ildefonso, Adrian, Khachatrian, Ani, McMorrow, Dale, Cressler, John D.
Published in IEEE transactions on nuclear science (01.04.2024)
Published in IEEE transactions on nuclear science (01.04.2024)
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An Introduction to Ultra-Fast Silicon Detectors
Ferrero, Marco, Arcidiacono, Roberta, Mandurrino, Marco, Sola, Valentina, Cartiglia, Nicolò
Year of Publication 2021
Year of Publication 2021
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Book
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Hot Carrier Degradation of p-LDMOS Transistors for RF Applications
Kraft, J., Loffler, B., Knaipp, M., Wachmann, E.
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
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Safe Operation of Maximum Temperature for Planar Gate SiC Mosfet under Avalanche Stress Shock
Li, Xuan, Hou, Zijie, Tong, Xing, Deng, Xiaochuan, Jiang, Junning, Zhang, Yourun, Zhang, Bo
Published in Meeting abstracts (Electrochemical Society) (01.09.2019)
Published in Meeting abstracts (Electrochemical Society) (01.09.2019)
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Comparison between Heavy Ion and Pulsed Laser Simulation to reproduce SEE Tests
Fernandez-Martinez, P., Lopez-Calle, I., Hidalgo, S., Franco, F.J., Flores, D., de Agapito, J.A.
Published in 2009 Spanish Conference on Electron Devices (01.02.2009)
Published in 2009 Spanish Conference on Electron Devices (01.02.2009)
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Hot-Electron Effects in AlGaN/GaN HEMTs Under Semi-ON DC Stress
Minetto, Andrea, Deutschmann, Bernd, Modolo, Nicola, Nardo, Arianna, Meneghini, Matteo, Zanoni, Enrico, Sayadi, Luca, Prechtl, Gerhard, Sicre, Sebastien, Haberlen, Oliver
Published in IEEE transactions on electron devices (01.11.2020)
Published in IEEE transactions on electron devices (01.11.2020)
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Technology computer-aided design (TCAD)-based virtual fabrication
Year of Publication 01.10.2013
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Technology Computer-Aided Design (TCAD)-Based Virtual Fabrication
Year of Publication 11.09.2012
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Patent
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Radiation Hardened Millimeter-Wave Receiver Implemented in 90-nm, SiGe HBT Technology
Al Seragi, Ebrahim M., Dash, Subhra, Muthuseenu, K., Cressler, John D., Barnaby, Hugh J., Khachatrian, Ani, Buchner, Stephen P., McMorrow, Dale, Zeinolabedinzadeh, Saeed
Published in IEEE transactions on nuclear science (01.10.2022)
Published in IEEE transactions on nuclear science (01.10.2022)
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Proposal for variability-induced effective radius of elliptical gate-all-around junctionless transistors and its applicability in hydrogen gas sensors
Sharma, Princy, Kumar, Subindu, Kumar, Pankaj
Published in International journal of electronics and communications (01.06.2024)
Published in International journal of electronics and communications (01.06.2024)
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Investigation of Tunnel Field Effect Transistor for Biosensing Applications
Vijh, Manjula, Gupta, R. S., Pandey, Sujata
Published in Progress in Electromagnetics Research Symposium (01.06.2019)
Published in Progress in Electromagnetics Research Symposium (01.06.2019)
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Fin shape fluctuations in FinFET: Correlation to electrical variability and impact on 6-T SRAM noise margins
Baravelli, Emanuele, De Marchi, Luca, Speciale, Nicolò
Published in Solid-state electronics (01.12.2009)
Published in Solid-state electronics (01.12.2009)
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Modeling observed capacitance–voltage hysteresis in metal–SiO2-thin film organic semiconductor devices
Niemann, Darrell, Gunther, Norman, Kwong, Charles, Barycza, Mark, Rahman, Mahmud
Published in Solid-state electronics (01.06.2006)
Published in Solid-state electronics (01.06.2006)
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