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On-chip optical interconnects versus electrical interconnects for high-performance applications

by Stucchi, Michele, Cosemans, Stefan, Van Campenhout, Joris, Tőkei, Zsolt, Beyer, Gerald
Published in Microelectronic engineering (01.12.2013)

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Full reliability study of advanced metallization options for 30 nm A12pitch interconnects

by Croes, Kristof, Demuynck, Steven, Siew, Yong, Pantouvaki, Marianna, Wilson, Christopher, Heylen, Nancy, Beyer, Gerald, TAkei, Zsolt
Published in Microelectronic engineering (01.06.2013)

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Journal Article

On-chip optical interconnects versus electrical interconnects for high-performance applications

Full reliability study of advanced metallization options for 30 nm A12pitch interconnects

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