Anomalous Gate-Edge Leakage Induced by High Tensile Stress in NMOSFET
LIU, Po-Tsun, HUANG, Chen-Shuo, LIM, Peng-Soon, LEE, Da-Yuan, TSAO, Shueh-Wen, CHEN, Chi-Chun, TAO, Hun-Jan, MII, Yuh-Jier
Published in IEEE electron device letters (01.11.2008)
Published in IEEE electron device letters (01.11.2008)
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Journal Article
An experimentally validated analytical model for gate line-edge roughness (LER) effects on technology scaling
Diaz, C.H., Hun-Jan Tao, Yao-Ching Ku, Yen, A., Young, K.
Published in IEEE electron device letters (01.06.2001)
Published in IEEE electron device letters (01.06.2001)
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Journal Article
25 nm CMOS Omega FETs
YANG, Fu-Liang, CHEN, Hao-Yu, TAO, Hun-Jan, YEO, Yee-Chia, LIANG, Mong-Song, CHENMING HU, CHEN, Fang-Cheng, HUANG, Cheng-Chuan, CHANG, Chang-Yun, CHIU, Hsien-Kuang, LEE, Chi-Chuang, CHEN, Chi-Chun, HUANG, Huan-Tsung, CHEN, Chih-Jian
Published in Digest. International Electron Devices Meeting (2002)
Published in Digest. International Electron Devices Meeting (2002)
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Conference Proceeding
Two-dimensional dopant profiling by electrostatic force microscopy using carbon nanotube modified cantilevers
Chin, Shu-Cheng, Chang, Yuan-Chih, Hsu, Chen-Chih, Lin, Wei-Hsiang, Wu, Chih-I, Chang, Chia-Seng, Tsong, Tien T, Woon, Wei-Yen, Lin, Li-Te, Tao, Hun-Jan
Published in Nanotechnology (13.08.2008)
Published in Nanotechnology (13.08.2008)
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Journal Article
Reliability of HfSiON as gate dielectric for advanced CMOS technology
Wang, H.C.-H., Ching-Wei Tsai, Shang-Jr Chen, Chien-Tai Chan, Huan-Just Lin, Ying Jin, Hun-Jan Tao, Shih-Chang Chen, Diaz, C.H., Tongchern Ong, Oates, A.S., Mong-Song Liang, Min-Hwa Chi
Published in Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005 (2005)
Published in Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005 (2005)
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Conference Proceeding
HfSiON Gate Dielectric for 45nm Node Low-Power Device
Tian-Choy Gan, Wang, H.C.-H., Shang-Jr Chen, Ching-Wei Tsai, Peng-Soon Lim, Huan-Just Lin, Ying Jin, Hun-Jan Tao, Shih-Chang Chen, Ying Keung Leung, Diaz, C.H., Mong-Song Liang, Yuh-Jier Mii
Published in 2006 International Symposium on VLSI Technology, Systems, and Applications (01.04.2006)
Published in 2006 International Symposium on VLSI Technology, Systems, and Applications (01.04.2006)
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Conference Proceeding
A low operating power FinFET transistor module featuring scaled gate stack and strain engineering for 32/28nm SoC technology
Chih-Chieh Yeh, Chih-Sheng Chang, Hong-Nien Lin, Wei-Hsiung Tseng, Li-Shyue Lai, Tsu-Hsiu Perng, Tsung-Lin Lee, Chang-Yun Chang, Liang-Gi Yao, Chia-Cheng Chen, Ta-Ming Kuan, Xu, J J, Chia-Cheng Ho, Tzu-Chiang Chen, Shyue-Shyh Lin, Hun-Jan Tao, Min Cao, Chih-Hao Chang, Ting-Chu Ko, Neng-Kuo Chen, Shih-Cheng Chen, Chia-Pin Lin, Hsien-Chin Lin, Ching-Yu Chan, Hung-Ta Lin, Shu-Ting Yang, Jyh-Cheng Sheu, Chu-Yun Fu, Shih-Ting Hung, Feng Yuan, Ming-Feng Shieh, Chia-Feng Hu, Wann, C
Published in 2010 International Electron Devices Meeting (01.12.2010)
Published in 2010 International Electron Devices Meeting (01.12.2010)
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Conference Proceeding
Transient charging and discharging behaviors of border traps in the dual-layer HfO2/SiO2 high-k gate stack observed by using low-frequency charge pumping method
WU, Wei-Hao, TSUI, Bing-Yue, CHEN, Mao-Chieh, HOU, Yong-Tian, YIN JIN, TAO, Hun-Jan, CHEN, Shih-Chang, LIANG, Mong-Song
Published in IEEE transactions on electron devices (01.06.2007)
Published in IEEE transactions on electron devices (01.06.2007)
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Journal Article
Low power device technology with SiGe channel, HfSiON, and poly-Si gate
Wang, H.C.-H., Shang-Jr Chen, Ming-Fang Wang, Pang-Yen Tsai, Ching-Wei Tsai, Ta-Wei Wang, Ting, S.M., Tuo-Hung Hou, Peng-Soon Lim, Huan-Just Lin, Ying Jin, Hun-Jan Tao, Shih-Chang Chen, Diaz, C.H., Mong-Song Liang, Chenming Hu
Published in IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004 (2004)
Published in IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004 (2004)
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Conference Proceeding
Effects of Base Oxide Thickness and Silicon Composition on Charge Trapping in HfSiO/SiO 2 High-k Gate Stacks
Wu, Wei-Hao, Chen, Mao-Chieh, Tsui, Bing-Yue, Hou, Yong-Tian, Yao, Liang-Gi, Jin, Yin, Tao, Hun-Jan, Chen, Shih-Chang, Liang, Mong-Song
Published in Japanese Journal of Applied Physics (01.08.2005)
Published in Japanese Journal of Applied Physics (01.08.2005)
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Journal Article