Transmission electron microscopy study of an AlN nucleation layer for the growth of GaN on a 7-degree off-oriented (0 0 1) Si substrate by metalorganic vapor phase epitaxy
Tanaka, Shigeyasu, Honda, Yoshio, Kameshiro, Norifumi, Iwasaki, Ryuta, Sawaki, Nobuhiko, Tanji, Takayoshi, Ichihashi, Mikio
Published in Journal of crystal growth (01.01.2004)
Published in Journal of crystal growth (01.01.2004)
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Electron Holography of a Hetero-Interface in a Solid Oxide Fuel Cell
Tanji, T, Moritomo, H, Shimura, T, Kato, T, Hirayama, T
Published in Microscopy and microanalysis (01.08.2007)
Published in Microscopy and microanalysis (01.08.2007)
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Electron differential microscopy using an electron trapezoidal prism
Tanji, Takayoshi, Manabe, Shizuo, Yamamoto, Kazuo, Hirayama, Tukasa
Published in Ultramicroscopy (1999)
Published in Ultramicroscopy (1999)
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Mapping of minority carrier lifetime distributions in multicrystalline silicon using transient electron-beam-induced current
Kushida, Takuya, Tanaka, Shigeyasu, Morita, Chiaki, Tanji, Takayoshi, Ohshita, Yoshio
Published in Journal of electron microscopy (01.10.2012)
Published in Journal of electron microscopy (01.10.2012)
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