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"TANIOKA MICHINAGA"
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"TANIOKA MICHINAGA"
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HIGH-FREQUENCY PROBE
by
UJIIE AKIRA
,
TANIOKA MICHINAGA
Year of Publication
23.01.2014
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ELECTROPLATING APPARATUS AND PLATING METHOD
by
KUBOTA TETSUYA
,
TANIOKA MICHINAGA
Year of Publication
10.06.2013
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PROBE FOR INSPECTING ENERGIZATION AND METHOD OF MANUFACTURING THE SAME, AND PROBE UNIT
by
ARIIZUMI SHOJI
,
TANIOKA MICHINAGA
Year of Publication
01.07.2010
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WIRING STRUCTURE, PROBE FOR INSPECTION, AND ITS MANUFACTURING METHOD
by
SATO RIEKO
,
TANIOKA MICHINAGA
Year of Publication
21.01.2010
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METHOD OF MANUFACTURING PROBE CONTACT AND PROBE CONTACT
by
OSHIRO HIROYASU
,
TANIOKA MICHINAGA
Year of Publication
07.05.2009
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INSPECTION PROBE AND MANUFACTURING METHOD OF THE SAME
by
WAKABAYASHI YOSHINORI
,
SATO RIEKO
,
TANIOKA MICHINAGA
Year of Publication
04.04.2013
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MOUNTING STRUCTURE FOR ELECTRONIC COMPONENT
by
TANIOKA MICHINAGA
Year of Publication
06.03.1998
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JP2646989B
by
TANIOKA MICHINAGA
Year of Publication
27.08.1997
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MCM CARRIER
by
TANIOKA MICHINAGA
Year of Publication
11.06.1996
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CHIP CARRIER
by
TANIOKA MICHINAGA
Year of Publication
28.07.1995
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METHOD FOR MANUFACTURING MULTILAYER-STRUCTURE PROBE AND PROBE
by
ARIIZUMI SHOJI
,
WAKABAYASHI YOSHINORI
,
TANIOKA MICHINAGA
Year of Publication
03.06.2010
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INSPECTING DEVICE AND INSPECTING METHOD OF SEMICONDUCTOR DEVICE
by
KOKATSU TOSHINOBU
,
TANIOKA MICHINAGA
Year of Publication
27.05.2004
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SINGLE POINT TAB BONDER PROVIDED WITH BUMP HEATING MECHANISM
by
TANIOKA MICHINAGA
Year of Publication
07.10.1994
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ELEMENT INSPECTION METHOD FOR ELECTRIC CONTACT STRUCTURE
by
ITO KATSUMICHI
,
TANIOKA MICHINAGA
,
NEMOTO YOSHIHIKO
Year of Publication
10.09.2009
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Method for manufacturing a test probe having a sheet body
by
TANIOKA
,
MICHINAGA
,
KIMURA, TAKAHIRO
Year of Publication
11.02.2003
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STRUCTURE OF PROBE FOR INSPECTING SEMICONDUCTOR DEVICE AND METHOD OF MAKING THE SAME
by
KIMURA TAKAHIRO
,
TANIOKA MICHINAGA
Year of Publication
11.09.2002
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PROBE STRUCTURE AND ITS MANUFACTURING METHOD
by
KIMURA TAKAHIRO
,
TANIOKA MICHINAGA
Year of Publication
17.05.2002
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AUXILIARY DEVICE FOR INSPECTING BEAR CHIP, AND METHOD FOR INSPECTION
by
KIMURA TAKAHIRO
,
TANIOKA MICHINAGA
Year of Publication
26.01.2001
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INSPECTION PROBE AND ITS MANUFACTURE
by
KIMURA TAKAHIRO
,
TANIOKA MICHINAGA
Year of Publication
26.01.2001
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TEST CARRIER AND INSPECTION METHOD FOR BARE CHIP
by
KIMURA TAKAHIRO
,
TANIOKA MICHINAGA
Year of Publication
14.09.2000
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