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TEST CARRIER
by
TANIOKA
,
MICHINOBU
,
AKIYAMA, YUKIHARU
Year of Publication
16.03.2006
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INSPECTION PROBE
by
HATTORI, ATSUO
,
TANIOKA
,
MICHINOBU
Year of Publication
28.10.2004
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Probe for inspecting semiconductor device and method of manufacturing the same
by
TANIOKA MICHINOBU
,
KIMURA TAKAHIRO
Year of Publication
13.09.2002
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PROBE STRUCTURE AND METHOD FOR MANUFACTURING THE SAME
by
TANIOKA MICHINOBU
,
KIMURA TAKAHIRO
Year of Publication
07.05.2002
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TEST PROBE WITH SEAT BODY
by
TANIOKA MICHINOBU
,
KIMURA TAKAHIRO
Year of Publication
26.02.2001
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SEMICONDUCTOR DEVICE INSPECTING APPARATUS AND POWER SUPPLY UNIT
by
HOSHINO, SHIGEKI
,
TANIOKA
,
MICHINOBU
,
TAURA, TORU
Year of Publication
15.03.2007
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SEMICONDUCTOR DEVICE
by
HOSHINO, SHIGEKI
,
TANIOKA
,
MICHINOBU
,
TAURA, TORU
Year of Publication
15.03.2007
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Inspection probe
by
TANIOKA MICHINOBU
,
HATTORI ATSUO
Year of Publication
16.06.2009
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Inspection probe
by
Tanioka
,
Michinobu
,
Hattori, Atsuo
Year of Publication
16.06.2009
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Inspection probe
by
TANIOKA MICHINOBU
,
HATTORI ATSUO
Year of Publication
21.09.2006
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Inspection probe
by
TANIOKA MICHINOBU
,HATTORI ATSUO
Year of Publication
17.05.2006
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MCM (Multi Chip Module) carrier with external connection teminals BGA (Ball Grid Array) type matrix array form
by
TANIOKA
;
MICHINOBU
Year of Publication
21.07.1998
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Semiconductor device for implementing signal transmission and/or power supply by means of the induction of a coil
by
Hoshino, Shigeki
,
Tanioka
,
Michinobu
,
Taura, Toru
Year of Publication
15.03.2011
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Semiconductor device for implementing signal transmission and/or power supply by means of the induction of a coil
by
TANIOKA MICHINOBU
,
TAURA TORU
,
HOSHINO SHIGEKI
Year of Publication
15.03.2011
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Semiconductor device inspection apparatus and inspection method
by
Tanioka
,
Michinobu
,
Ogatsu, Toshinobu
Year of Publication
14.06.2005
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Semiconductor device inspection apparatus and inspection method
by
TANIOKA MICHINOBU
,
OGATSU TOSHINOBU
Year of Publication
14.06.2005
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Semiconductor device testing apparatus and power supply unit for semiconductor device testing apparatus
by
TANIOKA MICHINOBU
,
TAURA TORU
,
HOSHINO SHIGEKI
Year of Publication
14.12.2010
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Semiconductor device testing apparatus and power supply unit for semiconductor device testing apparatus
by
Tanioka
,
Michinobu
,
Hoshino, Shigeki
,
Taura, Toru
Year of Publication
14.12.2010
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TWI384226B
by
TANIOKA
,
MICHINOBU
,
OOSHIRO, HIROYASU
Year of Publication
01.02.2013
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Semiconductor device inspection apparatus and inspection method
by
TANIOKA MICHINOBU
,
OGATSU TOSHINOBU
Year of Publication
27.05.2004
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