Search Results - "TANIMOTO NORIFUMI" :: K.UTB vyhledávací portál | TBU Library Retrieval Portal

CHARGED PARTICLE BEAM SYSTEM

CHARGED PARTICLE BEAM SYSTEM

by TANIMOTO NORIFUMI, NAKAMURA YUSUKE, OHASHI KENYOSHI, ABE YUSUKE
Year of Publication 10.11.2022

Get full text

Patent

ELECTRON MICROSCOPE AND FOCUS ADJUSTMENT METHOD THEREOF

ELECTRON MICROSCOPE AND FOCUS ADJUSTMENT METHOD THEREOF

by TANIMOTO NORIFUMI, OHASHI KENYOSHI, KIN KEISHIN, ABE YUSUKE
Year of Publication 13.12.2021

Get full text

Patent

SCANNING ELECTRON MICROSCOPE AND PATTERN MEASUREMENT METHOD

SCANNING ELECTRON MICROSCOPE AND PATTERN MEASUREMENT METHOD

by TANIMOTO NORIFUMI, OHASHI KENYOSHI, KIN KEISHIN, ABE YUSUKE, BIZEN KAORI
Year of Publication 22.02.2021

Get full text

Patent

CHARGED PARTICLE BEAM DEVICE

CHARGED PARTICLE BEAM DEVICE

by TANIMOTO NORIFUMI, TAKAHASHI HIDEICHIRO, GOTO YASUNORI, ABE YUSUKE, SAKAI KEI, YAMAGUCHI SATOSHI, HITOMI KEIICHIRO, YAMAMOTO TAKUMA
Year of Publication 16.05.2022

Get full text

Patent

CHARGED PARTICLE BEAM DEVICE AND PATTERN MEASUREMENT METHOD

CHARGED PARTICLE BEAM DEVICE AND PATTERN MEASUREMENT METHOD

by TANIMOTO NORIFUMI, OTA HIROYA, NOJIRI MASAAKI, TAMORI TOMOHIRO, ABE YUSUKE, YAMAMOTO TAKUMA
Year of Publication 27.05.2021

Get full text

Patent

CHARGED PARTICLE BEAM DEVICE

CHARGED PARTICLE BEAM DEVICE

by TANIMOTO NORIFUMI, DOI TAKASHI, MATSUNAGA SOICHIRO, TODOKORO HIDEO, KAWANO HAJIME, ISHIKAWA SHUHEI, KATAGIRI SOUICHI, KASUYA KEIGO
Year of Publication 26.03.2020

Get full text

Patent

CHARGED PARTICLE BEAM DEVICE AND CHARGE ELIMINATION METHOD THEREFOR

CHARGED PARTICLE BEAM DEVICE AND CHARGE ELIMINATION METHOD THEREFOR

by TANIMOTO NORIFUMI, ITAI HIDEKI, NOJIRI MASAAKI, ISHIKAWA SHUHEI, YAMAMOTO TAKUMA
Year of Publication 03.08.2017

Get full text

Patent

CHARGED PARTICLE BEAM DEVICE

CHARGED PARTICLE BEAM DEVICE

by TANIMOTO NORIFUMI, OTA HIROYA, SAKAKIBARA SHIN, HAYATA YASUNARI, ABE YUSUKE, BIZEN KAORI
Year of Publication 22.03.2019

Get full text

Patent

CHARGED PARTICLE BEAM DEVICE, AND METHOD OF MEASURING SUPERPOSITION DEVIATION AMOUNT

CHARGED PARTICLE BEAM DEVICE, AND METHOD OF MEASURING SUPERPOSITION DEVIATION AMOUNT

by TANIMOTO NORIFUMI, FUNAKOSHI TOMOHIRO, YAMAMOTO TAKUMA
Year of Publication 12.05.2014

Get full text

Patent

CHARGED PARTICLE BEAM DEVICE AND METHOD OF KNOWING ELECTROSTATIC CHARGE CONDITION IN SURFACE OF SAMPLE

CHARGED PARTICLE BEAM DEVICE AND METHOD OF KNOWING ELECTROSTATIC CHARGE CONDITION IN SURFACE OF SAMPLE

by TANIMOTO NORIFUMI, SUZUKI MAKOTO
Year of Publication 20.08.2009

Get full text

Patent

ELECTRON BEAM APPLICATION DEVICE AND ELECTRON BEAM ADJUSTMENT METHOD

ELECTRON BEAM APPLICATION DEVICE AND ELECTRON BEAM ADJUSTMENT METHOD

by TANIMOTO NORIFUMI, SAKAKIBARA SHIN, ABE YUSUKE, YAMAMOTO TAKUMA
Year of Publication 28.11.2013

Get full text

Patent

ELECTRON BEAM APPLICATION DEVICE AND LENS ARRAY

ELECTRON BEAM APPLICATION DEVICE AND LENS ARRAY

by TANIMOTO NORIFUMI, OTA HIROYA, TANIMOTO AKIYOSHI, SAKAKIBARA SHIN, MARUYAMA MOMOYO
Year of Publication 30.09.2013

Get full text

Patent

INSPECTION METHOD AND DEVICE USING ELECTRONIC BEAM

INSPECTION METHOD AND DEVICE USING ELECTRONIC BEAM

by TANIMOTO NORIFUMI, SASAKI HIROKO
Year of Publication 04.11.2005

Get full text

Patent

CHARGED PARTICLE BEAM DEVICE AND METHOD FOR STABLY OBTAINING CHARGED PARTICLE BEAM IMAGE

CHARGED PARTICLE BEAM DEVICE AND METHOD FOR STABLY OBTAINING CHARGED PARTICLE BEAM IMAGE

by TANIMOTO NORIFUMI, SUZUKI MAKOTO, YAMAMOTO TAKUMA
Year of Publication 20.01.2011

Get full text

Patent

CHARGED PARTICLE BEAM DEVICE

CHARGED PARTICLE BEAM DEVICE

by TANIMOTO NORIFUMI, SASAKI HIROKO, SUZUKI MAKOTO
Year of Publication 02.02.2006

Get full text

Patent

ELECTRICALLY-CHARGED PARTICLE BEAM DEVICE

ELECTRICALLY-CHARGED PARTICLE BEAM DEVICE

by TANIMOTO NORIFUMI, SASAKI HIROKO, SHINADA HIROYUKI
Year of Publication 02.12.2004

Get full text

Patent

PATTERN INSPECTION/MEASUREMENT DEVICE

PATTERN INSPECTION/MEASUREMENT DEVICE

by TANIMOTO NORIFUMI, OMORI KIYOKO, TEI TOMOKI, MAKINO HIROSHI
Year of Publication 07.02.2008

Get full text

Patent

APPARATUS AND METHOD FOR INSPECTING SEMICONDUCTOR WAFER

APPARATUS AND METHOD FOR INSPECTING SEMICONDUCTOR WAFER

by TANIMOTO NORIFUMI, HIROI TAKASHI, SASAKI HIROKO, MAKINO HIROSHI
Year of Publication 20.12.2007

Get full text

Patent

INSPECTION DEVICE AND INSPECTION METHOD

INSPECTION DEVICE AND INSPECTION METHOD

by TANIMOTO NORIFUMI, TEI TOMOKI, MAKINO HIROSHI, KOYAMA HIKARI
Year of Publication 11.10.2007

Get full text

Patent

CHARGE CONTROL DEVICE AND MEASURING DEVICE INCLUDING THE CHARGE CONTROL DEVICE

CHARGE CONTROL DEVICE AND MEASURING DEVICE INCLUDING THE CHARGE CONTROL DEVICE

by TANIMOTO NORIFUMI, TEI TOMOKI, MAKINO HIROSHI, TODOKORO HIDEO
Year of Publication 07.09.2006

Get full text

Patent