A Stand-Alone, Physics-Based, Measurement-Driven Model and Simulation Tool for Random Telegraph Signals Originating From Experimentally Identified MOS Gate-Oxide Defects
Nour, Mohamed, Celik-Butler, Zeynep, Sonnet, Arif, Fan-Chi Hou, Shaoping Tang, Mathur, Guru
Published in IEEE transactions on electron devices (01.04.2016)
Published in IEEE transactions on electron devices (01.04.2016)
Get full text
Journal Article
RF CMOS on high-resistivity substrates for system-on-chip applications
Benaissa, K., Jau-Yuann Yang, Crenshaw, D., Williams, B., Sridhar, S., Ai, J., Boselli, G., Song Zhao, Shaoping Tang, Ashburn, S., Madhani, P., Blythe, T., Mahalingam, N., Shichijo, H.S.
Published in IEEE transactions on electron devices (01.03.2003)
Published in IEEE transactions on electron devices (01.03.2003)
Get full text
Journal Article
Evaluating the minimum thickness of gate oxide on silicon using first-principles method
Tang, Shaoping, Wallace, Robert M, Seabaugh, Alan, King-Smith, Dominic
Published in Applied surface science (01.09.1998)
Published in Applied surface science (01.09.1998)
Get full text
Journal Article
Changes in Quality of Fruits during Maturity of Four Main Citrus Varieties in Ruili, Yunnan
Yanfen YANG, Minxian DUAN, Birong ZHANG, Suyun YAN, Wenbin SHI, Shaoping TANG, Li PAN, Xianyan ZHOU
Published in Guangdong nong ye ke xue (01.04.2024)
Published in Guangdong nong ye ke xue (01.04.2024)
Get full text
Journal Article
Variability of random telegraph noise in analog MOS transistors
Nour, Mohamed, Mahmud, M. Iqbal, Celik-Butler, Zeynep, Basu, Debarshi, Shaoping Tang, Fan-Chi Hou, Wise, Rick
Published in 2013 22nd International Conference on Noise and Fluctuations (ICNF) (01.06.2013)
Published in 2013 22nd International Conference on Noise and Fluctuations (ICNF) (01.06.2013)
Get full text
Conference Proceeding
Device physics impact on low leakage, high speed DSP design techniques
Scott, D., Shaoping Tang, Song Zhao, Nandakumar, M.
Published in Proceedings International Symposium on Quality Electronic Design (2002)
Published in Proceedings International Symposium on Quality Electronic Design (2002)
Get full text
Conference Proceeding