Modeling of a hybrid marine current-hydrogen active power generation system
Barakat, M.R., Tala-Ighil, B., Gualous, H., Hissel, D.
Published in International journal of hydrogen energy (12.04.2019)
Published in International journal of hydrogen energy (12.04.2019)
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Journal Article
Supercapacitor ageing at constant temperature and constant voltage and thermal shock
Gualous, H., Gallay, R., Alcicek, G., Tala-Ighil, B., Oukaour, A., Boudart, B., Makany, Ph
Published in Microelectronics and reliability (01.09.2010)
Published in Microelectronics and reliability (01.09.2010)
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Journal Article
Conference Proceeding
Calendar and cycling ageing of activated carbon supercapacitor for automotive application
Gualous, H., Gallay, R., Al Sakka, M., Oukaour, A., Tala-Ighil, B., Boudart, B.
Published in Microelectronics and reliability (01.09.2012)
Published in Microelectronics and reliability (01.09.2012)
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Journal Article
Conference Proceeding
Experimental and comparative study of gamma radiation effects on Si-IGBT and SiC-JFET
Tala-Ighil, B., Trolet, J.-L., Gualous, H., Mary, P., Lefebvre, S.
Published in Microelectronics and reliability (01.08.2015)
Published in Microelectronics and reliability (01.08.2015)
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Journal Article
Characterization of high-voltage IGBT module degradations under PWM power cycling test at high ambient temperature
Tounsi, M., Oukaour, A., Tala-Ighil, B., Gualous, H., Boudart, B., Aissani, D.
Published in Microelectronics and reliability (01.09.2010)
Published in Microelectronics and reliability (01.09.2010)
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Journal Article
Conference Proceeding
Ageing defect detection on IGBT power modules by artificial training methods based on pattern recognition
Oukaour, A., Tala-Ighil, B., Pouderoux, B., Tounsi, M., Bouarroudj-Berkani, M., Lefebvre, S., Boudart, B.
Published in Microelectronics and reliability (01.02.2011)
Published in Microelectronics and reliability (01.02.2011)
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Journal Article
Supercapacitors aging diagnosis using least square algorithm
Oukaour, A., Pouliquen, M., Tala-Ighil, B., Gualous, H., Pigeon, E., Gehan, O., Boudart, B.
Published in Microelectronics and reliability (01.09.2013)
Published in Microelectronics and reliability (01.09.2013)
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Journal Article
Conference Proceeding
Total ionising dose effects on punch-through insulated gate bipolar transistors turn-on switching behaviour
Tala-Ighil, B., Oukaour, A., Gualous, H., Boudart, B., Pouderoux, B., Trolet, J-L., Piccione, M.
Published in Microelectronics and reliability (01.09.2011)
Published in Microelectronics and reliability (01.09.2011)
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Journal Article
Conference Proceeding
Trench insulated gate bipolar transistors submitted to high temperature bias stress
Maïga, C.O., Toutah, H., Tala-Ighil, B., Boudart, B.
Published in Microelectronics and reliability (01.09.2005)
Published in Microelectronics and reliability (01.09.2005)
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Journal Article
Conference Proceeding
Comparison Between the Behaviour of Punch-Through and Non-Punch-Through Insulated Gate Bipolar Transistors Under High Temperature Reverse Bias Stress
MAIGA, C. O, TOUTAH, H, TALA-IGHIL, B, BOUDART, B
Published in Microelectronics and reliability (01.09.2004)
Published in Microelectronics and reliability (01.09.2004)
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Journal Article
Conference Proceeding
State creation under gate-bias stress in polysilicon TFTs studied from the temperature-transfer characteristics behavior
Toutah, H., Llibre, J.F., Tala-Ighil, B., Boudart, B., Mohammed-Brahim, T.
Published in Thin solid films (03.03.2003)
Published in Thin solid films (03.03.2003)
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Journal Article
Conference Proceeding
Study of the stability of polycrystalline silicon by means of the behavior of thin film transistors under gate bias stress
Mohammed-Brahim, T., Rahal, A., Gautier, G., Raoult, F., Toutah, H., Tala-Ighil, B., Llibre, J.F.
Published in Journal of non-crystalline solids (01.04.2002)
Published in Journal of non-crystalline solids (01.04.2002)
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Journal Article
State creation induced by gate bias stress in unhydrogenated polysilicon TFTs
Tala-Ighil, B., Rahal, A., Mourgues, K., Toutah, A., Pichon, L., Mohammed-Brahim, T., Raoult, F., Bonnaud, O.
Published in Thin solid films (01.01.1999)
Published in Thin solid films (01.01.1999)
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Journal Article
Conference Proceeding
Stability of unhydrogenated polysilicon thin film transistors and structural quality of the channel material
Toutah, H., Tala-Ighil, B., Llibre, J.F., Rahal, A., Mourgues, K., Helen, Y., Mohammed-Brahim, T., Dassow, R., Köhler, J.R.
Published in Thin solid films (15.02.2001)
Published in Thin solid films (15.02.2001)
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Journal Article
Conference Proceeding
Improved stability of large area excimer laser crystallised polysilicon Thin Film Transistors under DC and AC operating
Toutah, H, Llibre, J F, Tala-Ighil, B, Mohammed-Brahim, T, Helen, Y, Gautier, G, Bonnaud, O
Published in Microelectronics and reliability (01.09.2001)
Published in Microelectronics and reliability (01.09.2001)
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Journal Article
Stability of polysilicon thin film transistors under switch operating
Toutah, H., Llibre, J.F., Tala-Ighil, B., Mohammed-Brahim, T., Mourgues, K., Helen, Y., Raoult, F., Bonnaud, O.
Published in Microelectronics and reliability (01.08.2000)
Published in Microelectronics and reliability (01.08.2000)
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Journal Article
Gate bias stress in hydrogenated and unhydrogenated polysilicon thin film transistors
Tala-Ighil, B., Toutah, H., Rahal, A., Mourgues, K., Pichon, L., Raoult, F., Bonnaud, O., Mohammed-Brahim, T.
Published in Microelectronics and reliability (01.06.1998)
Published in Microelectronics and reliability (01.06.1998)
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Journal Article
Conference Proceeding