Transconductance Distribution in Program/Erase Cycling of NAND Flash Memory Devices: a Statistical Investigation
Chiu, Yung-Yueh, Lin, I-Chun, Chang, Kai-Chieh, Yang, Bo-Jun, Takeshita, Toshiaki, Yano, Masaru, Shirota, Riichiro
Published in IEEE transactions on electron devices (01.03.2019)
Published in IEEE transactions on electron devices (01.03.2019)
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Journal Article
The origin of oxide degradation during time interval between program/erase cycles in NAND Flash memory devices
Chiu, Yung-Yueh, Tsai, Hung-Te-En, Chang, Kai-Chieh, Kumari, Roshni, Li, Hsin-Chiao, Takeshita, Toshiaki, Yano, Masaru, Shirota, Riichiro
Published in Japanese Journal of Applied Physics (01.07.2021)
Published in Japanese Journal of Applied Physics (01.07.2021)
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Journal Article
Impact of Program/Erase Cycling Interval on the Transconductance Distribution of NAND Flash Memory Devices
Chiu, Yung-Yueh, Chang, Kai-Chieh, Lin, Hsin-Jyun, Tsai, Hung-Te-En, Lin, Po-Jui, Li, Hsin-Chiao, Takeshita, Toshiaki, Yano, Masaru, Shirota, Riichiro
Published in IEEE transactions on electron devices (01.11.2020)
Published in IEEE transactions on electron devices (01.11.2020)
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Journal Article
Effects of Hydrogen on Endurance Characteristics in NAND Flash Memories
Chiu, Yung-Yueh, Liu, Wen-Chien, Chen, Yu-Jung, Kumaria, Roshni, Takeshita, Toshiaki, Yano, Masaru, Shirota, Riichiro
Published in ECS Advances (07.12.2022)
Published in ECS Advances (07.12.2022)
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Synthesis of new dithiolene-derivative metal complexes
Naito, Toshio, Takeshita, Toshiaki, Kobayashi, Norihito, Inabe, Tamotsu
Published in Molecular crystals and liquid crystals (Philadelphia, Pa. : 2003) (01.01.2002)
Published in Molecular crystals and liquid crystals (Philadelphia, Pa. : 2003) (01.01.2002)
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The effect of hydrogen on programmed threshold-voltage distribution in NAND flash memories
Chiu, Yung-Yueh, Lin, Cheng-Han, Yang, Jhih-Siang, Yang, Bo-Jun, Aoki, Minoru, Takeshita, Toshiaki, Yano, Masaru, Shirota, Riichiro
Published in Japanese Journal of Applied Physics (01.08.2019)
Published in Japanese Journal of Applied Physics (01.08.2019)
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