Joint reliability study of solder capped metal pillar bump interconnections on an organic substrate
Toriyama, K., Takeoka, Y., Okamoto, K., Noma, H., Orii, Y.
Published in 2012 2nd IEEE CPMT Symposium Japan (01.12.2012)
Published in 2012 2nd IEEE CPMT Symposium Japan (01.12.2012)
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