Final report on VAMAS round-robin study to evaluate a correction method for saturation effects in DSIMS
Takano, Akio, Nonaka, Hidehiko, Homma, Yoshikazu, Tomita, Mitsuhiro, Murase, Atsushi, Hayashi, Syunichi, Barozzi, Mario, Kim, Kyung Joon, Sykes, David, Simons, David, Bennett, Joe, Magee, Charles W.
Published in Surface and interface analysis (01.06.2015)
Published in Surface and interface analysis (01.06.2015)
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Journal Article
Development of a Certified Reference Material with Delta-Doped Boron Nitride Layers for Surface Depth-Profile Analysis
Kurokawa, Akira, Azuma, Yasushi, Terauchi, Shinya, Takatsuka, Toshiko, Narukawa, Tomohiro, Takano, Akio, Mizuno, Seiichiro, Sameshima, Junichiro
Published in E-journal of surface science and nanotechnology (16.04.2016)
Published in E-journal of surface science and nanotechnology (16.04.2016)
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Journal Article
Development of a Certified Reference Material with Delta-Doped Boron Nitride Layers for Surface Depth-Profile Analysis
Kurokawa, Akira, Azuma, Yasushi, Terauchi, Shinya, Takatsuka, Toshiko, Narukawa, Tomohiro, Takano, Akio, Mizuno, Seiichiro, Sameshima, Junichiro
Published in E-journal of surface science and nanotechnology (01.01.2016)
Published in E-journal of surface science and nanotechnology (01.01.2016)
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Journal Article
AFM Tip Characterizer fabricated by Si/SiO2 multilayers
Takenaka, Hisataka, Hatayama, Masatoshi, Ito, Hisashi, Ohchi, Tadayuki, Takano, Akio, Kurosawa, Satoru, Itoh, Hiroshi, Ichimura, Shingo
Published in E-journal of surface science and nanotechnology (01.01.2011)
Published in E-journal of surface science and nanotechnology (01.01.2011)
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Journal Article
Quantitative and Qualitative Analyses of Mass Spectra of OEL Materials by Artificial Neural Network and Interface Evaluation: Results from a VAMAS Interlaboratory Study
Aoyagi, Satoka, Cant, David J. H., Dürr, Michael, Eyres, Anya, Fearn, Sarah, Gilmore, Ian S., Iida, Shin-ichi, Ikeda, Reiko, Ishikawa, Kazutaka, Lagator, Matija, Lockyer, Nicholas, Keller, Philip, Matsuda, Kazuhiro, Murayama, Yohei, Okamoto, Masayuki, Reed, Benjamen P., Shard, Alexander G., Takano, Akio, Trindade, Gustavo F., Vorng, Jean-Luc
Published in Analytical chemistry (Washington) (10.10.2023)
Published in Analytical chemistry (Washington) (10.10.2023)
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Journal Article
Evaluation of Time-of-Flight Secondary Ion Mass Spectrometry Spectra of Peptides by Random Forest with Amino Acid Labels: Results from a Versailles Project on Advanced Materials and Standards Interlaboratory Study
Aoyagi, Satoka, Fujiwara, Yukio, Takano, Akio, Vorng, Jean-Luc, Gilmore, Ian S, Wang, Yung-Chen, Tallarek, Elke, Hagenhoff, Birgit, Iida, Shin-ichi, Luch, Andreas, Jungnickel, Harald, Lang, Yusheng, Shon, Hyun Kyong, Lee, Tae Geol, Li, Zhanping, Matsuda, Kazuhiro, Mihara, Ichiro, Miisho, Ako, Murayama, Yohei, Nagatomi, Takaharu, Ikeda, Reiko, Okamoto, Masayuki, Saiga, Kunio, Tsuchiya, Toshihiko, Uemura, Shigeaki
Published in Analytical chemistry (Washington) (09.03.2021)
Published in Analytical chemistry (Washington) (09.03.2021)
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Journal Article
Round‐robin test for the measurement of layer thickness of multilayer films by secondary ion mass spectrometry depth profiling
Kim, Kyung Joong, Jang, Jong Shik, Bennett, Joe, Simons, David, Barozzi, Mario, Takano, Akio, Li, Zhanping, Magee, Charles
Published in Surface and interface analysis (01.11.2017)
Published in Surface and interface analysis (01.11.2017)
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