Experimental measurements validate the use of the binary encounter approximation model to accurately compute proton induced dose and radiolysis enhancement from gold nanoparticles
Hespeels, F, Lucas, S, Tabarrant, T, Scifoni, E, Kraemer, M, Chêne, G, Strivay, D, Tran, H N, Heuskin, A C
Published in Physics in medicine & biology (13.03.2019)
Published in Physics in medicine & biology (13.03.2019)
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Backscattered electron emission after proton impact on gold nanoparticles with and without polymer shell coating
Hespeels, F, Heuskin, A C, Tabarrant, T, Scifoni, E, Kraemer, M, Chêne, G, Strivay, D, Lucas, S
Published in Physics in medicine & biology (12.06.2019)
Published in Physics in medicine & biology (12.06.2019)
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Diffractive hygrochromic effect in the cuticle of the hercules beetle Dynastes hercules
Rassart, M, Colomer, J-F, Tabarrant, T, Vigneron, J P
Published in New journal of physics (11.03.2008)
Published in New journal of physics (11.03.2008)
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Characterization of water-based paints containing titanium dioxide or carbon black as manufactured nanomaterials before and after atomization
Fichera, Ornella, Alpan, Lütfiye, Laloy, Julie, Tabarrant, T., Uhrner, Ulrich, Ye, Qiaoyan, Mejia, Jorge, Dogné, Jean-Michel, Lucas, Stéphane
Published in Applied nanoscience (01.06.2019)
Published in Applied nanoscience (01.06.2019)
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Molecular depth profiling of model biological films using low energy monoatomic ions
Brison, J., Mine, N., Wehbe, N., Gillon, X., Tabarrant, T., Sporken, R., Houssiau, L.
Published in International journal of mass spectrometry (15.05.2012)
Published in International journal of mass spectrometry (15.05.2012)
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TOF-SIMS depth profiling of multilayer amino-acid films using large Argon cluster Ar+n, C+60 and Cs+ sputtering ions: A comparative study
WEHBE, N, TABARRANT, T, BRISON, J, MOUHIB, T, DELCORTE, A, BERTRAND, P, MOELLERS, R, NIEHUIS, E, HOUSSIAU, L
Published in Surface and interface analysis (2013)
Published in Surface and interface analysis (2013)
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TOF-SIMS depth profiling of multilayer amino-acid films using large Argon cluster Arn+, C60+ and Cs+ sputtering ions: A comparative study
Wehbe, N., Tabarrant, T., Brison, J., Mouhib, T., Delcorte, A., Bertrand, P., Moellers, R., Niehuis, E., Houssiau, L.
Published in Surface and interface analysis (01.01.2013)
Published in Surface and interface analysis (01.01.2013)
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