by Kundu, Souvik, Soulie, J.-P., Marti, G., Okudur, F. U., Kundu, Shreya, Souriau, L., Lazzarino, F., Murdoch, G., Park, S., Tokei, Z.
Published in IEEE electron device letters (01.10.2024)

by Jourdan, Nicolas, Carbonell, Laureen, Heylen, Nancy, Swerts, Johan, Armini, S., Caro, A. Maestre, Demuynck, S., Croes, K., Beyer, G., Tökei, Zsolt, Elshocht, S. Van, Vancoille, E.
Published in ECS transactions (01.01.2011)

by Tökei, Zs, Viefhaus, H, Grabke, H.J
Published in Applied surface science (15.09.2000)

by Vega-Gonzalez, Victor, Radisic, D., Chan, Bt, Choudhury, S., Wang, S., Mingardi, A., Le, Q. Toan, Decoster, H., Oniki, Y., Puttarame, P., Vandersmissen, K., Soulie, J.-P., Peter, A., Batuk, A. Sepulveda. D., Martinez, G. T., Richard, O., Boemmels, J., Biesemans, S., Dentoni, E., Horiguchi, N., Park, S., Tokei, Z.
Published in 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (11.06.2023)

by Vandevelde, Bart, Ivankovic, A., Debecker, B., Lofrano, M., Vanstreels, K., Guo, W., Cherman, V., Gonzalez, M., Van der Plas, G., De Wolf, I., Beyne, E., Tokei, Z.
Published in Microelectronics and reliability (01.06.2014)

by Samavedam, S. B., Ryckaert, J., Beyne, E., Ronse, K., Horiguchi, N., Tokei, Z., Radu, I., Bardon, M. G., Na, M. H., Spessot, A., Biesemans, S.
Published in 2020 IEEE International Electron Devices Meeting (IEDM) (12.12.2020)

by Maestre Caro, A., Travaly, Y., Beyer, G., Tokei, Z., Maes, G., Borghs, G., Armini, S.
Published in Microelectronic engineering (01.06.2013)

by Raghavan, P., Bardon, M. Garcia, Jang, D., Schuddinck, P., Yakimets, D., Ryckaert, J., Mercha, A., Horiguchi, N., Collaert, N., Mocuta, A., Mocuta, D., Tokei, Z., Verkest, D., Thean, A., Steegen, A.
Published in 2015 IEEE Custom Integrated Circuits Conference (CICC) (01.09.2015)

by Thean, A. V.-Y, Yakimets, D., Huynh Bao, T., Schuddinck, P., Sakhare, S., Bardon, M. Garcia, Sibaja-Hernandez, A., Ciofi, I., Eneman, G., Veloso, A., Ryckaert, J., Raghavan, P., Mercha, A., Mocuta, A., Tokei, Z., Verkest, D., Wambacq, P., De Meyer, K., Collaert, N.
Published in 2015 Symposium on VLSI Technology (VLSI Technology) (01.06.2015)

by Tőkei, Z., Hennesen, K., Viefhaus, H., Grabke, H.J.
Published in Materials science and technology (01.10.2000)

by Volders, H, Tokei, Z, Bender, H, Brijs, B, Caluwaerts, R, Carbonell, L, Conard, T, Drijbooms, C, Franquet, A, Garaud, S, Hoflijk, I, Moussa, A, Sinapi, F, Travaly, Y, Vanhaeren, D, Vereecke, G, Zhao, C, Li, W-M, Sprey, H
Published in Microelectronic engineering (01.11.2007)

by Leaming-Sphabmixay, K., Van Olmen, J., Moon, K.J., Vanstreels, Kris, D’Haen, J., Tokei, Z., List, S., Beyer, G.
Published in Microelectronic engineering (01.11.2007)

by Horiguchi, N., Mertens, H., Chiarella, T., Demuynck, S., Vega-Gonzalez, V., Vandooren, A., Veloso, A., Bardon, M. Garcia, Sisto, G., Gupta, A., Tokei, Z., Biesemans, S., Ryckaert, J.
Published in 2023 International Electron Devices Meeting (IEDM) (09.12.2023)

by Shamiryan, D., Paraschiv, V., Tőkei, Z., Beckx, S., Boullart, W.
Published in Electrochemical and solid-state letters (01.01.2006)

by Leaming-Sphabmixay, K, Van Olmen, J, Moon, K J, Vanstreels, Kris, D'Haen, J, Tokei, Z, List, S, Beyer, G
Published in Microelectronic engineering (01.11.2007)

by van der Veen, Marleen H., Maes, J. W., Pedreira, O. Varela, Zhu, C., Tierno, D., Datta, S., Jourdan, N., Decoster, S., Wu, C., Mousa, M., Byun, Y., Struyf, H., Park, S., Tokei, Z.
Published in 2023 IEEE International Interconnect Technology Conference (IITC) and IEEE Materials for Advanced Metallization Conference (MAM)(IITC/MAM) (01.05.2023)

by Marien, P., Gonzalez, V. V., Choudhury, S., Radisic, D., Decoster, S., Kundu, S., Hermans, Y., Kenens, B., De Coster, H., Sanchez, E. A., Peter, A., Marquez, A. S., Jourdan, N., Batuk, D., Ryckaert, J., Murdoch, G., Park, S., Tokei, Z.
Published in 2023 IEEE International Interconnect Technology Conference (IITC) and IEEE Materials for Advanced Metallization Conference (MAM)(IITC/MAM) (01.05.2023)

by Montero, D., Marien, P., Hermans, Y., Vega-Gonzalez, V., Feurprier, Y., Oikawa, N., Buccheri, N., Wu, C., Martinez, G.T., Batuk, D., Puliyalil, H., Decoster, S., Kumar, K., Lazzarino, F., Murdoch, G., Park, S., Tokei, Z.
Published in 2023 IEEE International Interconnect Technology Conference (IITC) and IEEE Materials for Advanced Metallization Conference (MAM)(IITC/MAM) (01.05.2023)

by Travaly, Y., Mandeep, B., Carbonell, L., Tokei, Z., Van Olmen, J., Iacopi, F., Van Hove, M., Stucchi, M., Maex, K.
Published in IEEE transactions on semiconductor manufacturing (01.08.2007)

by Croes, K, Wilson, C J, Lofrano, M, Vereecke, B, Beyer, G P, Tökei, Z
Published in 2010 IEEE International Reliability Physics Symposium (01.05.2010)