by Tierno, D., Varela Pedreira, O., Wu, C., Jourdan, N., Kljucar, L., Tőkei, Zs, Croes, K.
Published in Microelectronics and reliability (01.09.2019)

by Pedreira, O. Varela, Croes, K., Lesniewska, A., Wu, C., van der Veen, M. H., de Messemaeker, J., Vandersmissen, K., Jourdan, N., Wen, L. G., Adelmann, C., Briggs, B., Gonzalez, V. Vega, Bömmels, J., Tokei, Zs
Published in 2017 IEEE International Reliability Physics Symposium (IRPS) (01.04.2017)

by Croes, K., Wu, C., Kocaay, D., Li, Y., Roussel, Ph, Bömmels, J., Tőkei, Zs
Published in ECS journal of solid state science and technology (01.01.2015)

by Atanasova, T. A., Carbonell, L., Caluwaerts, R., Tőkei, Zs, Strubbe, K., Vereecken, P. M.
Published in Journal of the Electrochemical Society (01.01.2013)

by Zhao, C., Tőkei, Zs, Haider, A., Demuynck, S.
Published in Microelectronic engineering (01.11.2007)

by Fillot, F., Tőkei, Zs, Beyer, G.P.
Published in Surface science (15.02.2007)

by Afanas’ev, V.V., Keunen, K., Stesmans, A., Jivanescu, M., Tőkei, Zs, Baklanov, M.R., Beyer, G.P.
Published in Microelectronic engineering (01.07.2011)

by Hoofman, R.J.O.M., Verheijden, G.J.A.M., Michelon, J., Iacopi, F., Travaly, Y., Baklanov, M.R., Tökei, Zs, Beyer, G.P.
Published in Microelectronic engineering (01.06.2005)

by Croes, K., Roussel, Ph, Barbarin, Y., Wu, C., Li, Y., Bommels, J., Tokei, Zs
Published in 2013 IEEE International Reliability Physics Symposium (IRPS) (01.04.2013)

by Kumaresan, V., Wilson, C.J., Verdonck, P., Van Besien, E., Lazzarino, F., Truffert, V., Bömmels, J., Tokei, Zs, Wong, T.K.S.
Published in Microelectronic engineering (25.05.2014)

by Tang, B.J., Croes, K., Barbarin, Y., Wang, Y.Q., Degraeve, R., Li, Y., Toledano-Luque, M., Kauerauf, T., Bömmels, J., Tőkei, Zs, De Wolf, I.
Published in Microelectronics and reliability (01.09.2014)

by Croes, K., Cannatá, G., Zhao, L., Tőkei, Zs
Published in Microelectronics and reliability (01.08.2008)

by Das, A., Le, Q.T., Furukawa, Y., Nguyen, V.H., Terzieva, V., de Theije, F., Whelan, C.M., Maenhoudt, M., Struyf, H., Tókei, Zs, Iacopi, F., Stucchi, M., Carbonell, L., Vos, I., Bender, H., Patz, M., Beyer, G., Van Hove, M., Maex, K.
Published in Microelectronic engineering (01.11.2003)

by Volders, H., Carbonell, L., Heylen, N., Kellens, K., Zhao, C., Marrant, K., Faelens, G., Conard, T., Parmentier, B., Steenbergen, J., Peer, M. Van de, Wilson, C.J., Sleeckx, E., Beyer, G.P., Tőkei, Zs, Gravey, V., Shah, K., Cockburn, A.
Published in Microelectronic engineering (01.05.2011)

by Stesmans, A., Nguyen, A.P.D., Houssa, M., Afanas’ev, V.V., Tőkei, Zs, Baklanov, M.R.
Published in Microelectronic engineering (01.09.2013)

by Wu, C., Li, Y., Barbarin, Y., Ciofi, I., Tang, B., Kauerauf, T., Croes, K., Bommels, J., De Wolf, I., Tokei, Zs
Published in 2014 IEEE International Reliability Physics Symposium (01.06.2014)

by Vereecke, B., Pantouvaki, M., Ciofi, I., Beyer, G.P., Tökei, Zs
Published in Microelectronic engineering (01.05.2011)

by Tőkei, Zs, Patz, M., Schmidt, M., Iacopi, F., Demuynck, S., Maex, K.
Published in Microelectronic engineering (01.10.2004)

by Erdélyi, Z., Girardeaux, Ch, Tôkei, Zs, Beke, D.L., Cserháti, Cs, Rolland, A.
Published in Surface science (2002)

by Croes, K., Adelmann, Ch, Wilson, C.J., Zahedmanesh, H., Pedreira, O. Varela, Wu, C., Lesniewska, A., Oprins, H., Beyne, S., Ciofi, I., Kocaay, D., Stucchi, M., Tokei, Zs
Published in 2018 IEEE International Electron Devices Meeting (IEDM) (01.12.2018)