Interface failure criterion of button shear test as a means of interface adhesion measurement in plastic packages
Szeto, W.K., Xie, M.Y., Kim, J.K., Yuen, M.M.F., Tong, P., Yi, S.
Published in International Symposium on Electronic Materials and Packaging (EMAP2000) (Cat. No.00EX458) (2000)
Published in International Symposium on Electronic Materials and Packaging (EMAP2000) (Cat. No.00EX458) (2000)
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