Formation and nonvolatile memory characteristics of W nanocrystals by in-situ steam generation oxidation
Chen, Shih-Cheng, Chang, Ting-Chang, Hsieh, Chieh-Ming, Li, Hung-Wei, Sze, S.M., Nien, Wen-Ping, Chan, Chia-Wei, Yeh(Huang), Fon-Shan, Tai, Ya-Hsiang
Published in Thin solid films (30.12.2010)
Published in Thin solid films (30.12.2010)
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Conference Proceeding
Nonvolatile memory effect of tungsten nanocrystals under oxygen plasma treatments
Chen, Shih-Cheng, Chang, Ting-Chang, Chen, Wei-Ren, Lo, Yuan-Chun, Wu, Kai-Ting, Sze, S.M., Chen, Jason, Liao, I.H., Yeh(Huang), Fon-Shan
Published in Thin solid films (01.10.2010)
Published in Thin solid films (01.10.2010)
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Journal Article
Conference Proceeding
Temperature-dependent memory characteristics of silicon–oxide–nitride–oxide–silicon thin-film-transistors
Chen, Shih-Ching, Chang, Ting-Chang, Wu, Yung-Chun, Chin, Jing-Yi, Syu, Yong-En, Sze, S.M., Chang, Chun-Yen, Wu, Hsing-Hua, Chen, Yi-Chan
Published in Thin solid films (03.05.2010)
Published in Thin solid films (03.05.2010)
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Journal Article
Passivation Effect of Poly-Si Thin-Film Transistors With Fluorine-Ion-Implanted Spacers
Wei-Ren Chen, Ting-Chang Chang, Po-Tsun Liu, Chen Jung Wu, Chun-Hao Tu, Sze, S.M., Chun-Yen Chang
Published in IEEE electron device letters (01.06.2008)
Published in IEEE electron device letters (01.06.2008)
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The effects of plasma treatment for low dielectric constant hydrogen silsesquioxane (HSQ)
LIU, P. T, CHANG, T. C, HUANG, H. D, SZE, S. M, PAN, F. M, MEI, Y. J, WU, W. F, TSAI, M. S, DAI, B. T, CHANG, C. Y, SHIH, F. Y
Published in Thin solid films (02.11.1998)
Published in Thin solid films (02.11.1998)
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Conference Proceeding
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Enhancing the resistance of low- k hydrogen silsesquioxane (HSQ) to wet stripper damage
Chang, T.C., Mor, Y.S., Liu, P.T., Tsai, T.M., Chen, C.W., Mei, Y.J., Sze, S.M.
Published in Thin solid films (01.11.2001)
Published in Thin solid films (01.11.2001)
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Characterization of porous silicate for ultra-low k dielectric application
Liu, Po-tsun, Chang, T.C, Hsu, K.C, Tseng, T.Y, Chen, L.M, Wang, C.J, Sze, S.M
Published in Thin solid films (01.07.2002)
Published in Thin solid films (01.07.2002)
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Numerical simulation of quantum effects in high-k gate dielectric MOS structures using quantum mechanical models
Li, Yiming, Lee, Jam-Wem, Tang, Ting-Wei, Chao, Tien-Sheng, Lei, Tan-Fu, Sze, S.M.
Published in Computer physics communications (01.08.2002)
Published in Computer physics communications (01.08.2002)
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Journal Article
Conference Proceeding
Ambipolar Schottky-barrier TFTs
Horng-Chih Lin, Kuan-Lin Yeh, Tiao-Yuan Huang, Ruo-Gu Huang, Sze, S.M.
Published in IEEE transactions on electron devices (01.02.2002)
Published in IEEE transactions on electron devices (01.02.2002)
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Journal Article
Calculation of induced electron states in three-dimensional semiconductor artificial molecules
Li, Yiming, Voskoboynikov, O., Lee, C.P., Sze, S.M.
Published in Computer physics communications (01.08.2002)
Published in Computer physics communications (01.08.2002)
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Conference Proceeding
A comprehensive study of enhanced characteristics with localized transition in interface-type vanadium-based devices
Lin, C.-Y., Chen, P.-H., Chang, T.-C., Huang, W.-C., Tan, Y.-F., Lin, Y.-H., Chen, W.-C., Lin, C.-C., Chang, Y.-F., Chen, Y.-C., Huang, H.-C., Ma, X.-H., Hao, Y., Sze, S.M.
Published in Materials today physics (01.06.2020)
Published in Materials today physics (01.06.2020)
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Bipolar resistive switching of chromium oxide for resistive random access memory
Chen, Shih-Cheng, Chang, Ting-Chang, Chen, Shih-Yang, Chen, Chi-Wen, Chen, Shih-Ching, Sze, S.M., Tsai, Ming-Jinn, Kao, Ming-Jer, Yeh, Fon-Shan
Published in Solid-state electronics (01.08.2011)
Published in Solid-state electronics (01.08.2011)
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Analytical modeling of polycrystalline silicon emitter bipolar transistors under high-level injection
Chyan, Yih-Feng, Chang, Chun-Yen, Sze, S.M., Lin, Meng-Jang, Liao, Kenneth, Reif, Rafael
Published in Solid-state electronics (01.08.1994)
Published in Solid-state electronics (01.08.1994)
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Influence of hydrogen plasma treatment on charge storage characteristics in high density tungsten nanocrystal nonvolatile memory
Chen, Shih-Cheng, Chang, Ting-Chang, Chen, Wei-Ren, Lo, Yuan-Chun, Wu, Kai-Ting, Sze, S.M., Chen, Jason, Liao, I.H., Yeh(Huang), Fon-Shan
Published in Thin solid films (31.03.2011)
Published in Thin solid films (31.03.2011)
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