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System-Level Test Case Prioritization Using Machine Learning
Lachmann, Remo, Schulze, Sandro, Nieke, Manuel, Seidl, Christoph, Schaefer, Ina
Published in 2016 15th IEEE International Conference on Machine Learning and Applications (ICMLA) (01.12.2016)
Published in 2016 15th IEEE International Conference on Machine Learning and Applications (ICMLA) (01.12.2016)
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Conference Proceeding
Electronics design and testing of the CMS Fast Beam Condition Monitor for HL-LHC
Shibin, K, Auzinger, G, Bakhshiansohi, H, Dabrowski, A, Dierlamm, A, Dragicevic, M, Gholami, A, Gomez, G, Guthoff, M, Haranko, M, Homna, A, Jenihhin, M, Kaplon, J, Karacheban, O, Korcsmáros, B, Lokhovitskiy, A, Loos, R, Mallows, S, Michel, J, Myronenko, V, Pásztor, G, Schwandt, J, Sedghi, M, Shevelev, A, Steinbrueck, G, Stickland, D, Wegrzyn, G. J
Year of Publication 18.10.2024
Year of Publication 18.10.2024
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Journal Article
Intermittently Failing Tests in the Embedded Systems Domain
Strandberg, Per Erik, Ostrand, Thomas J, Weyuker, Elaine J, Afzal, Wasif, Sundmark, Daniel
Year of Publication 14.05.2020
Year of Publication 14.05.2020
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Journal Article
Electronics design and testing of the CMS Fast Beam Condition Monitor for HL-LHC
Shibin, K, Auzinger, G, Bakhshiansohi, H, Dabrowski, A, Dierlamm, A, Dragicevic, M, Gholami, A, Gomez, G, Guthoff, M, Haranko, M, Homna, A, Jenihhin, M, Kaplon, J, Karacheban, O, Korcsmáros, B, Lokhovitskiy, A, Loos, R, Mallows, S, Michel, J, Myronenko, V, Pásztor, G, Schwandt, J, Sedghi, M, Shevelev, A, Steinbrueck, G, Stickland, D, Wegrzyn, G J
Published in arXiv.org (18.10.2024)
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Published in arXiv.org (18.10.2024)
Paper
Intermittently Failing Tests in the Embedded Systems Domain
Strandberg, Per Erik, Ostrand, Thomas J, Weyuker, Elaine J, Afzal, Wasif, Sundmark, Daniel
Published in arXiv.org (14.05.2020)
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Published in arXiv.org (14.05.2020)
Paper
Upstream data analytics to optimize system test
Chen, Harry H., Shih, Peter
Published in 2016 China Semiconductor Technology International Conference (CSTIC) (01.03.2016)
Published in 2016 China Semiconductor Technology International Conference (CSTIC) (01.03.2016)
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Conference Proceeding