The energy-dispersive reflectometer at BESSY II: a challenge for thin film analysis
Pietsch, U., Grenzer, J., Geue, Th, Neissendorfer, F., Brezsesinski, G., Symietz, Ch, Möhwald, H., Gudat, W.
Published in Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment (2001)
Published in Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment (2001)
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Journal Article
X-ray reflectivity analysis of thin complex Langmuir-Blodgett films
Poloucek, P, Pietsch, U, Geue, T, Symietz, Ch, Brezesinski, G
Published in Journal of physics. D, Applied physics (21.02.2001)
Published in Journal of physics. D, Applied physics (21.02.2001)
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Journal Article