Fs level laser-to-RF synchronization at REGAE
Titberidze, M, Felber, M, Lamb, T, Loch, R, Sydlo, C, Schlarb, H
Published in Journal of physics. Conference series (01.07.2017)
Published in Journal of physics. Conference series (01.07.2017)
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Journal Article
Overview of SwissFEL dual-photocathode laser capabilities and perspectives for exotic FEL modes
Bettoni, S., Cavalieri, A., Dax, A., Divall, E., Hauri, C. P., Hunziker, S., Huppert, M., Kaiser, M., Paraliev, M., Sydlo, C., Vicario, C., Trisorio, A.
Published in High power laser science and engineering (01.01.2021)
Published in High power laser science and engineering (01.01.2021)
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Journal Article
Single-sampling-point coherent detection in continuous-wave photomixing terahertz systems
GÖBEL, T, SCHOENHERR, D, SYDLO, C, FEIGINOV, M, MEISSNER, P, HARTNAGEL, H. L
Published in Electronics letters (2009)
Published in Electronics letters (2009)
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Journal Article
Continuous-wave terahertz system with electro-optical terahertz phase control
GÖBEL, T, SCHOENHERR, D, SYDLO, C, FEIGINOV, M, MEISSNER, P, HARTNAGEL, H. L
Published in Electronics letters (03.07.2008)
Published in Electronics letters (03.07.2008)
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Journal Article
Continuous-wave single-sampling-point characterisation of optoelectronic on-chip terahertz transceiver
GÖBEL, T, SCHOENHERR, D, SYDLO, C, FEIGINOV, M, MEISSNER, P, HARTNAGEL, H. L
Published in Electronics letters (05.11.2009)
Published in Electronics letters (05.11.2009)
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Journal Article
Fast THz detectors based on InGaAs Schottky Diodes
Sydlo, C., Cojocari, O., Schçnherr, D., Goebel, T., Meissner, P., Hartnagel, H.L.
Published in Frequenz (01.06.2008)
Published in Frequenz (01.06.2008)
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Journal Article
Linewidth and Chirp of MEMS-VCSELs
Halbritter, H., Sydlo, C., Kogel, B., Riemenschneider, F., Hartnagel, H.L., Meissner, P.
Published in IEEE photonics technology letters (15.10.2006)
Published in IEEE photonics technology letters (15.10.2006)
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Journal Article
A MHz-repetition-rate hard X-ray free-electron laser driven by a superconducting linear accelerator
Abramsky, A., Aguirre, A., Altarelli, M., Anashin, V., Auguste, D., Ayvazyan, V., Balandin, V., Baldinger, R., Barbanotti, S., Belyakov, V., Bertucci, M., Beutner, B., Branlard, J., Brinker, F., Brüdgam, A., Büttner, T., Castro-Carballo, E., Chiodini, M., Choroba, S., Cunis, S., Czuba, K., de Zubiaurre Wagner, A., Dressel, M., Duda, P., Ehsan, W., Englisch, U., Feuker, S., Gołębiewski, Z., Graeff, W., Grebentsov, A., Hagge, L., Harms, E., Hauf, S., Henning, D., Hüning, M., Karstensen, S., Keil, B., Knebel, L., Kohlstrunk, N., Konopkova, Z., Kook, W., Koprek, W., Kotarba, A., Kreutzkamp, J., Kujala, N., Lamb, T., Larsson, M., Lenz, D., Leuschner, A., Levenhagen, F., Liu, J., Magueur, C., Maiano, C., Maltezopoulos, T., Matheisen, A., Mommerz, M., Morozov, I., Müller, J., Müller, K., Munilla, J., Münnich, A., Neumann, Reinhard, Noelle, D., Oliver, J. A., Omet, M., Ottmar, A., Oublaid, M., Pagani, C., Pienaud, Y., Pławski, E., Pohl, M., Popov, V., Racky, B., Rusiński, E., Samoylova, L., Sanzone, D., Schlarb, H., Scholz, M., Schultze, J., Semenov, E., Shemarykin, P., Silenzi, A., Simon, C., Skvorodnev, N., Steckel, M., Stodulski, M., Stolper, M., Syresin, E., Sytchev, V., Treyer, D., Trowitzsch, G., Vashchenko, G., Volobuev, E., Weichert, G., Wiebers, C., Wiencek, M., Wohlenberg, T., Zavadtsev, A., Zavadtsev, D., Zummack, F.
Published in Nature photonics (01.06.2020)
Published in Nature photonics (01.06.2020)
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Journal Article
Reliability investigations on LTG-GaAs photomixers for THz generation based on optical heterodyning
Sydlo, C., Sigmund, J., Mottet, B., Hartnagel, H.L.
Published in Microelectronics and reliability (01.09.2005)
Published in Microelectronics and reliability (01.09.2005)
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Journal Article
Conference Proceeding
Reliability studies on integrated GaAs power-sensor structures using pulsed electrical stress
Sydlo, C., Mutamba, K., Divac Krnic, L., Mottet, B., Hartnagel, H.L.
Published in Microelectronics and reliability (01.09.2003)
Published in Microelectronics and reliability (01.09.2003)
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Journal Article
Reliability investigations on HBV using pulsed electrical stress
Sydlo, C., Saglam, M., Mottet, B., Rodrı́guez-Gironés, M., Hartnagel, H.L.
Published in Microelectronics and reliability (01.09.2002)
Published in Microelectronics and reliability (01.09.2002)
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Journal Article
A method for HBT process control and defect detection using pulsed electrical stress
Sydlo, C., Mottet, B., Schüβler, M., Brandt, M., Hartnagel, H.L.
Published in Microelectronics and reliability (01.08.2000)
Published in Microelectronics and reliability (01.08.2000)
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Journal Article
Defect detection and modelling using pulsed electrical stress for reliability investigations of InGaP HBT
Sydlo, C., Mottet, B., Ganis, H., Hartnagel, H.L., Krozer, V., Delage, S.L., Cassette, S., Chartier, E., Floriot, D., Bland, S.
Published in Microelectronics and reliability (01.09.2001)
Published in Microelectronics and reliability (01.09.2001)
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Journal Article