Detection of near-interface traps in NO annealed 4H-SiC metal oxide semiconductor capacitors combining different electrical characterization methods
Vidarsson, Arnar M., Nicholls, Jordan R., Haasmann, Daniel, Dimitrijev, Sima, Sveinbjörnsson, Einar Ö.
Published in Journal of applied physics (07.06.2022)
Published in Journal of applied physics (07.06.2022)
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Journal Article
Deep traps in 4H-SiC MOS capacitors investigated by deep level transient spectroscopy
Sveinbjörnsson, Einar, Gislason, O.
Published in SILICON CARBIDE AND RELATED MATERIALS 2013, PTS 1 AND 2 (26.02.2014)
Published in SILICON CARBIDE AND RELATED MATERIALS 2013, PTS 1 AND 2 (26.02.2014)
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Conference Proceeding
Near-Interface Trap Model for the Low Temperature Conductance Signal in SiC MOS Capacitors With Nitrided Gate Oxides
Nicholls, Jordan R., Vidarsson, Arnar M., Haasmann, Daniel, Sveinbjornsson, Einar O., Dimitrijev, Sima
Published in IEEE transactions on electron devices (01.09.2020)
Published in IEEE transactions on electron devices (01.09.2020)
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Journal Article
Enhanced Mobility in InAlN/AlN/GaN HEMTs Using a GaN Interlayer
Malmros, Anna, Chen, Jr-Tai, Hjelmgren, Hans, Lu, Jun, Hultman, Lars, Kordina, Olof, Sveinbjornsson, Einar O., Zirath, Herbert, Rorsman, Niklas
Published in IEEE transactions on electron devices (01.07.2019)
Published in IEEE transactions on electron devices (01.07.2019)
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Journal Article
Trap and Inversion Layer Mobility Characterization Using Hall Effect in Silicon Carbide-Based MOSFETs With Gate Oxides Grown by Sodium Enhanced Oxidation
Tilak, V., Matocha, K., Dunne, G., Allerstam, F., Sveinbjornsson, E.O.
Published in IEEE transactions on electron devices (01.02.2009)
Published in IEEE transactions on electron devices (01.02.2009)
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Journal Article
Influence of Field Plates and Surface Traps on Microwave Silicon Carbide MESFETs
Nilsson, P.-A., Allerstam, F., Sudow, M., Andersson, K., Hjelmgren, H., Sveinbjornsson, E.O., Rorsman, N.
Published in IEEE transactions on electron devices (01.08.2008)
Published in IEEE transactions on electron devices (01.08.2008)
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Journal Article
The role of boron related defects in limiting charge carrier lifetime in 4H–SiC epitaxial layers
Ghezellou, Misagh, Kumar, Piyush, Bathen, Marianne E., Karsthof, Robert, Sveinbjörnsson, Einar Ö., Grossner, Ulrike, Bergman, J. Peder, Vines, Lasse, Ul-Hassan, Jawad
Published in APL materials (01.03.2023)
Published in APL materials (01.03.2023)
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Journal Article
Design and Fabrication of 4H-SiC RF MOSFETs
Gudjonsson, G.I., Allerstam, F., Sveinbjornsson, E.O., Hjelmgren, H., Nilsson, P.-A., Andersson, K., Zirath, H., Rodle, T., Jos, R.
Published in IEEE transactions on electron devices (01.12.2007)
Published in IEEE transactions on electron devices (01.12.2007)
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Journal Article
Observations of very fast electron traps at SiC/high-κ dielectric interfaces
Vidarsson, Arnar M., Persson, Axel R., Chen, Jr-Tai, Haasmann, Daniel, Hassan, Jawad Ul, Dimitrijev, Sima, Rorsman, Niklas, Darakchieva, Vanya, Sveinbjörnsson, Einar Ö.
Published in APL materials (01.11.2023)
Published in APL materials (01.11.2023)
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Journal Article
Electron Trapping in Extended Defects in Microwave AlGaN/GaN HEMTs With Carbon-Doped Buffers
Bergsten, Johan, Thorsell, Mattias, Adolph, David, Chen, Jr-Tai, Kordina, Olof, Sveinbjornsson, Einar O., Rorsman, Niklas
Published in IEEE transactions on electron devices (01.06.2018)
Published in IEEE transactions on electron devices (01.06.2018)
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Journal Article
Carrier Lifetime Controlling Defects Z(1/2) and RB1 in Standard and Chlorinated Chemistry Grown 4H-SiC
Booker, Ian Don, Ul Hassan, Jawad, Lilja, Louise, Beyer, Franziska, Karhu, Robin, Bergman, J. Peder, Danielsson, Örjan, Kordina, Olof, Sveinbjörnsson, Einar, Janzén, Erik
Published in Crystal growth & design (01.08.2014)
Published in Crystal growth & design (01.08.2014)
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Journal Article
Low density of near-interface traps at the AI2O3/4H-SIC interface with Al2O3 made by low temperature oxidation of Al
Khosa, Rabia Y., Sveinbjornsson, Einar O., Winters, Michael, ul Hassan, Jawad, Karhu, Robin, Janzen, Erik, Rorsman, Niklas
Published in 2016 European Conference on Silicon Carbide & Related Materials (ECSCRM) (01.09.2016)
Published in 2016 European Conference on Silicon Carbide & Related Materials (ECSCRM) (01.09.2016)
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Conference Proceeding
Carrier mobility as a function of temperature in as-grown and H-intercalated epitaxial graphenes on 4H-SiC
Winters, M., Thorsteinsson, E.B., Sveinbjornsson, E.O., Gislason, H.P., ul-Hassan, Jawad, Janzén, Erik, Rorsman, N.
Published in SILICON CARBIDE AND RELATED MATERIALS 2013, PTS 1 AND 2 (01.01.2014)
Published in SILICON CARBIDE AND RELATED MATERIALS 2013, PTS 1 AND 2 (01.01.2014)
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Conference Proceeding
Electrical Characterization of MOCVD Grown Single Crystalline AlN Thin Films on 4H-SiC
Karhu, Robin, Sveinbjörnsson, E.Ö., Khosa, Rabia Y., Hassan, Jawad, Chen, J.T., Pálsson, K., Rorsman, Niklas
Published in 12th European Conference on Silicon Carbide and Related Materials, ECSCRM 2018, Birmingham, United Kingdom (2019)
Published in 12th European Conference on Silicon Carbide and Related Materials, ECSCRM 2018, Birmingham, United Kingdom (2019)
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Journal Article
Conference Proceeding
Carrier Lifetime Controlling Defects Z 1/2 and RB1 in Standard and Chlorinated Chemistry Grown 4H-SiC
Booker, Ian D., Hassan, Jawad Ul, Lilja, Louise, Beyer, Franziska C., Karhu, Robin, Bergman, J. Peder, Danielsson, Örjan, Kordina, Olof, Sveinbjörnsson, Einar Ö., Janzén, Erik
Published in Crystal growth & design (06.08.2014)
Published in Crystal growth & design (06.08.2014)
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Journal Article
1200-V 5.2- \hbox\Omega\cdot\hbox^ 4H-SiC BJTs With a High Common-Emitter Current Gain
Hyung-Seok Lee, Domeij, M., Zetterling, C.-M., Ostling, M., Allerstam, F., Sveinbjornsson, E.O.
Published in IEEE electron device letters (01.11.2007)
Published in IEEE electron device letters (01.11.2007)
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Journal Article
Influence of Field Plates and Surface Traps on Microwave Silicon Carbide MESFETs : Silicon carbide devices and technology
NILSSON, Per-Ake, ALLERSTAM, Fredrik, SÜDOW, Mattias, ANDERSSON, Kristoffer, HJELMGREN, Hans, SVEINBJÖRNSSON, Einar O, RORSMAN, Niklas
Published in IEEE transactions on electron devices (2008)
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Published in IEEE transactions on electron devices (2008)
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