Extended model for the reconstruction of periodic multilayers from extreme ultraviolet and X‐ray reflectivity data
Svechnikov, Michael, Pariev, Dmitry, Nechay, Andrey, Salashchenko, Nikolay, Chkhalo, Nikolay, Vainer, Yuly, Gaman, Dmitry
Published in Journal of applied crystallography (01.10.2017)
Published in Journal of applied crystallography (01.10.2017)
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