by Kariya, T, Uchiyama, K, Tanaka, H, Hirono, T, Kuse, T, Yanagimoto, K, Henmi, M, Hirose, M, Kimura, I, Suu, K, Funakubo, H
Published in Journal of physics. Conference series (10.12.2015)

by Baumert, B. A., Chang, L.-H., Matsuda, A. T., Tsai, T.-L., Tracy, C. J., Gregory, R. B., Fejes, P. L., Cave, N. G., Chen, W., Taylor, D. J., Otsuki, T., Fujii, E., Hayashi, S., Suu, K.
Published in Journal of applied physics (01.09.1997)

by Masuda, T., Miyaguchi, Y., Tanimura, M., Nishioka, Y., Suu, K., Tani, N.
Published in Applied surface science (01.01.2001)

by Rozen, J., Suu, K., Hatanaka, M., Narayanan, V., Ogawa, Y., Ando, T., Bao, R., Cartier, E., Honda, K., Lee, K.-C., Bruley, J., Miyazoe, H.
Published in 2019 IEEE International Electron Devices Meeting (IEDM) (01.12.2019)

by Suzuki, A., Sasaki, S., Murayama, T., Kimura, I., Morikawa, Y., Jimbo, T.
Published in 2017 19th International Conference on Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS) (01.06.2017)

by Kim, W., Bruce, R.L., Masuda, T., Fraczak, G.W., Gong, N., Adusumilli, P., Ambrogio, S., Tsai, H., Bruley, J., Han, J.-P., Longstreet, M., Carta, F., Suu, K., BrightSky, M.
Published in 2019 Symposium on VLSI Technology (01.06.2019)

by Sky, M. Bright, Sosa, N., Masuda, T., Kim, W., Kim, S., Ray, A., Bruce, R., Gonsalves, J., Zhu, Y., Suu, K., Lam, C.
Published in 2015 IEEE International Electron Devices Meeting (IEDM) (01.12.2015)

by Kim, S., Sosa, N., BrightSky, M., Mori, D., Kim, W., Zhu, Y., Suu, K., Lam, C.
Published in 2013 IEEE International Electron Devices Meeting (01.12.2013)

by Suu, K., Osawa, A., Tani, N., Ishikawa, M., Nakamura, K., Ozawa, T., Sameshima, K., Kamisawa, A., Takasu, H.
Published in Integrated ferroelectrics (01.01.1997)

by Kim, W., Kim, S., Bruce, R., Carta, F., Fraczak, G., Ray, A., Lam, C., BrightSky, M., Zhu, Y., Masuda, T., Suu, K., Xie, Y., Kim, Y., Cha, J. J.
Published in 2018 IEEE International Reliability Physics Symposium (IRPS) (01.03.2018)

by Baumert, B. A., Chang, L.-H., Matsuda, A. T., Tsai, T.-L., Tracy, C. J., Gregory, R. B., Fejes, P. L., Cave, N. G., Chen, W., Remmel, T., Taylor, D. J., Otsuki, T., Fujii, E., Hayashi, S., Suu, K.
Published in Integrated ferroelectrics (01.09.1997)

by Kim, W., BrightSky, M., Masuda, T., Sosa, N., Kim, S., Bruce, R., Carta, F., Fraczak, G., Cheng, H. Y., Ray, A., Zhu, Y., Lung, H. L., Suu, K., Lam, C.
Published in 2016 IEEE International Electron Devices Meeting (IEDM) (01.12.2016)

by Morikawa, Y., Murayama, T., Sakuishi, T., Suzuki, A., Nakamuta, Y., Suu, K.
Published in 2014 IEEE 64th Electronic Components and Technology Conference (ECTC) (01.05.2014)

by Suu, K., Kimura, I., Kobayashi, H., Miyaguchi, Y., Masuda, T., Kokaze, Y., Jimbo, T.
Published in 2017 China Semiconductor Technology International Conference (CSTIC) (01.03.2017)

by Sakuishi, T., Murayama, T., Morikawa, Y., Suu, K.
Published in 2014 IEEE 64th Electronic Components and Technology Conference (ECTC) (01.05.2014)

by Ueda, M., Endo, M., Suu, K., Johnson, D.
Published in Integrated ferroelectrics (01.01.2001)

by Chu, F., Hickert, G., Hadnagy, T. D., Suu, K. K.
Published in Integrated ferroelectrics (01.10.1999)

by Nishioka, Yutaka, Masuda, Takeshi, Kajinuma, Masahiko, Yamada, Takakazu, Uematsu, Masaki, Suu, Koukou
Published in Integrated ferroelectrics (01.09.2003)

by Morikawa, Yasuhiro, Murayama, T., Sakuishi, T., Yoshii, M., Suu, K.
Published in 2012 IEEE 62nd Electronic Components and Technology Conference (01.05.2012)

by Chu, Fan, Fox, Glen, Davenport, Tom, Miyaguchi, Yuusuke, Suu, Koukou
Published in Integrated ferroelectrics (01.01.2002)