Trade-Offs Between RF Performance and Total-Dose Tolerance in 45-nm RF-CMOS
Arora, R., En Xia Zhang, Seth, S., Cressler, J. D., Fleetwood, D. M., Schrimpf, R. D., Rosa, G. L., Sutton, A. K., Nayfeh, H. M., Freeman, G.
Published in IEEE transactions on nuclear science (01.12.2011)
Published in IEEE transactions on nuclear science (01.12.2011)
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Journal Article
Proton-induced SEU in SiGe digital logic at cryogenic temperatures
Sutton, Akil. K., Moen, Kurt, Cressler, John D., Carts, Martin A., Marshall, Paul W., Pellish, Jonathan A., Ramachandran, Vishwa, Reed, Robert A., Alles, Michael L., Niu, Guofu
Published in Solid-state electronics (01.10.2008)
Published in Solid-state electronics (01.10.2008)
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Journal Article
Conference Proceeding
Impact of Technology Scaling in sub-100 nm nMOSFETs on Total-Dose Radiation Response and Hot-Carrier Reliability
Arora, Rajan, Fleetwood, Zachary E., En Xia Zhang, Lourenco, Nelson E., Cressler, John D., Fleetwood, Daniel M., Schrimpf, Ronald D., Sutton, Akil K., Freeman, Greg, Greene, Brian
Published in IEEE transactions on nuclear science (01.06.2014)
Published in IEEE transactions on nuclear science (01.06.2014)
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Journal Article
An Investigation of Single Event Transient Response in 45-nm and 32-nm SOI RF-CMOS Devices and Circuits
England, Troy D., Arora, Rajan, Fleetwood, Zachary E., Lourenco, Nelson E., Moen, Kurt A., Cardoso, Adilson S., McMorrow, Dale, Roche, Nicolas J.-H, Warner, Jeffery H., Buchner, Stephen P., Paki, Pauline, Sutton, Akil K., Freeman, Greg, Cressler, John D.
Published in IEEE transactions on nuclear science (01.12.2013)
Published in IEEE transactions on nuclear science (01.12.2013)
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Journal Article
Evaluating the Influence of Various Body-Contacting Schemes on Single Event Transients in 45-nm SOI CMOS
Moen, K A, Phillips, S D, Wilcox, E P, Cressler, J D, Nayfeh, H, Sutton, A K, Warner, J H, Buchner, S P, McMorrow, D, Vizkelethy, G, Dodd, P
Published in IEEE transactions on nuclear science (01.12.2010)
Published in IEEE transactions on nuclear science (01.12.2010)
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Journal Article
Proton and gamma radiation effects in a new first-generation SiGe HBT technology
Haugerud, Becca M., Pratapgarhwala, Mustansir M., Comeau, Jonathan P., Sutton, Akil K., Prakash, A.P. Gnana, Cressler, John D., Marshall, Paul W., Marshall, Cheryl J., Ladbury, Ray L., El-Diwany, Monir, Mitchell, Courtney, Rockett, Leonard, Bach, Tuyet, Lawrence, Reed, Haddad, Nadim
Published in Solid-state electronics (01.02.2006)
Published in Solid-state electronics (01.02.2006)
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Journal Article
An investigation of low-frequency noise in complementary SiGe HBTs
Enhai Zhao, Krithivasan, R., Sutton, A.K., Zhenrong Jin, Cressler, J.D., El-Kareh, B., Balster, S., Yasuda, H.
Published in IEEE transactions on electron devices (01.02.2006)
Published in IEEE transactions on electron devices (01.02.2006)
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Journal Article
An investigation of the effects of radiation exposure on stability constraints in epitaxial SiGe strained layers
Chen, Tianbing, Sutton, Akil K., Haugerud, Becca M., Henderson, Walter, Gnana Prakash, A.P., Cressler, John D., Doolittle, Alan, Liu, Xuefeng, Joseph, Alvin, Marshall, Paul W.
Published in Solid-state electronics (01.07.2006)
Published in Solid-state electronics (01.07.2006)
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Journal Article
Multiple-Bit Upset in 130 nm CMOS Technology
Tipton, A.D., Pellish, J.A., Reed, R.A., Schrimpf, R.D., Weller, R.A., Mendenhall, M.H., Sierawski, B., Sutton, A.K., Diestelhorst, R.M., Espinel, G., Cressler, J.D., Marshall, P.W., Vizkelethy, G.
Published in IEEE transactions on nuclear science (01.12.2006)
Published in IEEE transactions on nuclear science (01.12.2006)
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Journal Article
An Evaluation of Transistor-Layout RHBD Techniques for SEE Mitigation in SiGe HBTs
Sutton, A.K., Bellini, M., Cressler, J.D., Pellish, J.A., Reed, R.A., Marshall, P.W., Guofu Niu, Vizkelethy, G., Turowski, M., Raman, A.
Published in IEEE transactions on nuclear science (01.12.2007)
Published in IEEE transactions on nuclear science (01.12.2007)
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Journal Article
A Novel Device Architecture for SEU Mitigation: The Inverse-Mode Cascode SiGe HBT
Phillips, S.D., Thrivikraman, T., Appaswamy, A., Sutton, A.K., Cressler, J.D., Vizkelethy, G., Dodd, P., Reed, R.A.
Published in IEEE transactions on nuclear science (01.12.2009)
Published in IEEE transactions on nuclear science (01.12.2009)
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Journal Article
Heavy Ion Microbeam- and Broadbeam-Induced Transients in SiGe HBTs
Pellish, J.A., Reed, R.A., McMorrow, D., Vizkelethy, G., Cavrois, V.F., Baggio, J., Paillet, P., Duhamel, O., Moen, K.A., Phillips, S.D., Diestelhorst, R.M., Cressler, J.D., Sutton, A.K., Raman, A., Turowski, M., Dodd, P.E., Alles, M.L., Schrimpf, R.D., Marshall, P.W., LaBel, K.A.
Published in IEEE transactions on nuclear science (01.12.2009)
Published in IEEE transactions on nuclear science (01.12.2009)
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Journal Article
Laser-Induced Current Transients in Silicon-Germanium HBTs
Pellish, J.A., Reed, R.A., McMorrow, D., Melinger, J.S., Jenkins, P., Sutton, A.K., Diestelhorst, R.M., Phillips, S.D., Cressler, J.D., Pouget, V., Pate, N.D., Kozub, J.A., Mendenhall, M.H., Weller, R.A., Schrimpf, R.D., Marshall, P.W., Tipton, A.D., Niu, G.
Published in IEEE transactions on nuclear science (01.12.2008)
Published in IEEE transactions on nuclear science (01.12.2008)
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Journal Article
An Investigation of Dose Rate and Source Dependent Effects in 200 GHz SiGe HBTs
Sutton, A.K., Prakash, A.P.G., Bongim Jun, Enhai Zhao, Bellini, M., Pellish, J., Diestelhorst, R.M., Carts, M.A., Phan, A., Ladbury, R., Cressler, J.D., Marshall, Paul.W., Marshall, C.J., Reed, R.A., Schrimpf, R.D., Fleetwood, D.M.
Published in IEEE transactions on nuclear science (01.12.2006)
Published in IEEE transactions on nuclear science (01.12.2006)
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Journal Article
Substrate Engineering Concepts to Mitigate Charge Collection in Deep Trench Isolation Technologies
Pellish, J.A., Reed, R.A., Schrimpf, R.D., Alles, M.L., Varadharajaperumal, M., Guofu Niu, Sutton, A.K., Diestelhorst, R.M., Espinel, G., Krithivasan, R., Comeau, J.P., Cressler, J.D., Vizkelethy, G., Marshall, P.W., Weller, R.A., Mendenhall, M.H., Montes, E.J.
Published in IEEE transactions on nuclear science (01.12.2006)
Published in IEEE transactions on nuclear science (01.12.2006)
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Journal Article
Single Event Upset Mechanisms for Low-Energy-Deposition Events in SiGe HBTs
Montes, E.J., Reed, R.A., Pellish, J.A., Alles, M.L., Schrimpf, R.D., Weller, R.A., Varadharajaperumal, M., Niu, G., Sutton, A.K., Diestelhorst, R., Espinel, G., Krithivasan, R., Comeau, J.P., Cressler, J.D., Marshall, P.W., Vizkelethy, G.
Published in IEEE transactions on nuclear science (01.06.2008)
Published in IEEE transactions on nuclear science (01.06.2008)
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Journal Article
Application of RHBD Techniques to SEU Hardening of Third-Generation SiGe HBT Logic Circuits
Krithivasan, R., Marshall, P.W., Nayeem, M., Sutton, A.K., Wei-Min Kuo, Haugerud, B.M., Najafizadeh, L., Cressler, J.D., Carts, M.A., Marshall, C.J., Hansen, D.L., Jobe, K.-C.M., McKay, A.L., Guofu Niu, Reed, R., Randall, B.A., Burfield, C.A., Lindberg, M.D., Gilbert, B.K., Daniel, E.S.
Published in IEEE transactions on nuclear science (01.12.2006)
Published in IEEE transactions on nuclear science (01.12.2006)
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Journal Article
A comparison of gamma and proton radiation effects in 200 GHz SiGe HBTs
Sutton, A.K., Haugerud, B.M., Prakash, A.P.G., Bongim Jun, Cressler, J.D., Marshall, C.J., Marshall, P.W., Ladbury, R., Guarin, F., Joseph, A.J.
Published in IEEE transactions on nuclear science (01.12.2005)
Published in IEEE transactions on nuclear science (01.12.2005)
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Journal Article
The Effects of Irradiation Temperature on the Proton Response of SiGe HBTs
Prakash, A.P.G., Sutton, A.K., Diestelhorst, R.M., Espinel, G., Andrews, J., Bongim Jun, Cressler, J.D., Marshall, P.W., Marshall, C.J.
Published in IEEE transactions on nuclear science (01.12.2006)
Published in IEEE transactions on nuclear science (01.12.2006)
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Journal Article
A Generalized SiGe HBT Single-Event Effects Model for On-Orbit Event Rate Calculations
Pellish, J.A., Reed, R.A., Sutton, A.K., Weller, R.A., Carts, M.A., Marshall, P.W., Marshall, C.J., Krithivasan, R., Cressler, J.D., Mendenhall, M.H., Schrimpf, R.D., Warren, K.M., Sierawski, B.D., Niu, G.F.
Published in IEEE transactions on nuclear science (01.12.2007)
Published in IEEE transactions on nuclear science (01.12.2007)
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Journal Article