Reliability assessment in different HTO test conditions of AlGaN/GaN HEMTs
Malbert, N, Labat, N, Curutchet, A, Sury, C, Hoel, V, de Jaeger, J.-C, Defrance, N, Douvry, Y, Dua, C, Oualli, M, Piazza, M, Bru-Chevallier, C, Bluet, J.-M, Chikhaoui, W
Published in 2010 IEEE International Reliability Physics Symposium (01.05.2010)
Published in 2010 IEEE International Reliability Physics Symposium (01.05.2010)
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Conference Proceeding
AN EXPEDIENT SYNTHESIS OF ETHYL 4(5)-ALKYL(ARYL)THIOIMIDAZOLE-5(4)-CARBOXYLATE
CAILLE, JC, DIDIERLAURENT, S, LEFRANCOIS, D, LELIEVRE, MH, SURY, C, ASZODI, J
Published in Synthesis (Stuttgart) (01.06.1995)
Published in Synthesis (Stuttgart) (01.06.1995)
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Journal Article
Characterisation and modelling of parasitic effects and failure mechanisms in AlGaN/GaN HEMTs
Malbert, N., Labat, N., Curutchet, A., Sury, C., Hoel, V., de Jaeger, J.-C., Defrance, N., Douvry, Y., Dua, C., Oualli, M., Bru-Chevallier, C., Bluet, J.-M., Chikhaoui, W.
Published in Microelectronics and reliability (2009)
Published in Microelectronics and reliability (2009)
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Journal Article
Characterisation and modelling of parasitic effects and failure mechanisms in A1GaN/GaN HEMTs
MALBERT, N, LABAT, N, BRU-CHEVALLIER, C, BLUET, J.-M, CHIKHAOUI, W, CURUTCHET, A, SURY, C, HOEL, V, DE JAEGER, J.-C, DEFRANCE, N, DOUVRY, Y, DUA, C, OUALLI, M
Published in Microelectronics and reliability (2009)
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Published in Microelectronics and reliability (2009)
Conference Proceeding
Temperature dependent degradation modes in AlGaN/GaN HEMTs
Douvry, Y, Hoel, V, De Jaeger, J, Defrance, N, Sury, C, Malbert, N, Labat, N, Curutchet, A, Dua, C, Oualli, M, Piazza, M, Bluet, J, Chikhaoui, W, Bru-Chevallier, C
Published in The 5th European Microwave Integrated Circuits Conference (01.09.2010)
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Published in The 5th European Microwave Integrated Circuits Conference (01.09.2010)
Conference Proceeding