A Realistic March-12N Test And Diagnosis Algorithm For SRAM Memories
Wan Hasan, W.Z., Othman, M., Suparjo, B.S.
Published in 2006 IEEE International Conference on Semiconductor Electronics (01.11.2006)
Published in 2006 IEEE International Conference on Semiconductor Electronics (01.11.2006)
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Conference Proceeding
Towards a mixed-signal testability bus standard P1149.4
Wilkins, B.R., Oresjo, S., Suparjo, B.S.
Published in Proceedings ETC 93 Third European Test Conference (1993)
Published in Proceedings ETC 93 Third European Test Conference (1993)
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Conference Proceeding
DSP design using VLIW architecture
Lee, L., Suparjo, B.S., Wagiran, R., Sidek, R.
Published in ICSE 2000. 2000 IEEE International Conference on Semiconductor Electronics. Proceedings (Cat. No.00EX425) (2000)
Published in ICSE 2000. 2000 IEEE International Conference on Semiconductor Electronics. Proceedings (Cat. No.00EX425) (2000)
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Conference Proceeding
Design and characterisation of thick oxide parasitic transistor for MIMOS 0.8-/spl mu/m CMOS technology development
Roy Kooh Jinn Chye, Ahmad, M.R., Toh Hong Ting, Suparjo, B.S., Wagiran, R.
Published in ICSE'98. 1998 IEEE International Conference on Semiconductor Electronics. Proceedings (Cat. No.98EX187) (1998)
Published in ICSE'98. 1998 IEEE International Conference on Semiconductor Electronics. Proceedings (Cat. No.98EX187) (1998)
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Conference Proceeding
Maximization of fault detection in IC testing
Ali, L., Sidek, R., Aris, I., Ali, M.A.M., Suparjo, B.S.
Published in ICONIP '02. Proceedings of the 9th International Conference on Neural Information Processing. Computational Intelligence for the E-Age (IEEE Cat. No.02EX575) (2002)
Published in ICONIP '02. Proceedings of the 9th International Conference on Neural Information Processing. Computational Intelligence for the E-Age (IEEE Cat. No.02EX575) (2002)
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