A low-cost concurrent TSV test architecture with lossless test output compression scheme
Lee, Young-Woo, Lim, Hyunchan, Seo, Sungyoul, Cho, Keewon, Kang, Sungho
Published in PloS one (23.08.2019)
Published in PloS one (23.08.2019)
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Journal Article
Scan Chain Reordering-Aware X-Filling and Stitching for Scan Shift Power Reduction
Seo, Sungyoul, Lee, Yong, Lim, Hyeonchan, Lee, Joohwan, Yoo, Hongbom, Kim, Yojoung, Kang, Sungho
Published in 2015 IEEE 24th Asian Test Symposium (ATS) (01.11.2015)
Published in 2015 IEEE 24th Asian Test Symposium (ATS) (01.11.2015)
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Conference Proceeding
Journal Article
Reduced-Pin-Count BOST for Test-Cost Reduction
Lee, Youngkwang, Lee, Young-Woo, Seo, Sungyoul, Kang, Sungho
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.03.2022)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.03.2022)
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Journal Article
Off-chip test architecture for improving multi-site testing efficiency using tri-state decoder and 3V-level encoder
Sungyoul Seo, Hyeonchan Lim, Soyeon Kang, Sungho Kang
Published in 2017 18th International Symposium on Quality Electronic Design (ISQED) (01.03.2017)
Published in 2017 18th International Symposium on Quality Electronic Design (ISQED) (01.03.2017)
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Conference Proceeding
Broadcast scan compression based on deterministic pattern generation algorithm
Hyeonchan Lim, Sungyoul Seo, Soyeon Kang, Sungho Kang
Published in 2017 18th International Symposium on Quality Electronic Design (ISQED) (01.03.2017)
Published in 2017 18th International Symposium on Quality Electronic Design (ISQED) (01.03.2017)
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Conference Proceeding
A scan shifting method based on clock gating of multiple groups for low power scan testing
Sungyoul Seo, Yong Lee, Joohwan Lee, Sungho Kang
Published in Sixteenth International Symposium on Quality Electronic Design (01.03.2015)
Published in Sixteenth International Symposium on Quality Electronic Design (01.03.2015)
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Conference Proceeding
Advanced Low Pin Count Test Architecture for Efficient Multi-Site Testing
Seo, Sungyoul, Lee, Young-Woo, Lim, Hyeonchan, Kang, Sungho
Published in IEEE transactions on semiconductor manufacturing (01.08.2020)
Published in IEEE transactions on semiconductor manufacturing (01.08.2020)
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Journal Article
Software-based embedded core test using multi-polynomial for test data reduction
Soyeon Kang, Inhyuk Choi, Hyeonchan Lim, Sungyoul Seo, Sungho Kang
Published in 2016 International SoC Design Conference (ISOCC) (01.10.2016)
Published in 2016 International SoC Design Conference (ISOCC) (01.10.2016)
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Conference Proceeding
A test methodology to screen scan-path failures
Junghwan Kim, Young-woo Lee, Minho Cheong, Sungyoul Seo, Sungho Kang
Published in 2016 International SoC Design Conference (ISOCC) (01.10.2016)
Published in 2016 International SoC Design Conference (ISOCC) (01.10.2016)
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Conference Proceeding
Low power scan bypass technique with test data reduction
Hyunyul Lim, Wooheon Kang, Sungyoul Seo, Yong Lee, Sungho Kang
Published in Sixteenth International Symposium on Quality Electronic Design (01.03.2015)
Published in Sixteenth International Symposium on Quality Electronic Design (01.03.2015)
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Conference Proceeding
An efficient RPCT (Reduced Pin Count Testing) based on test data compression using burst clock controller in 3D-IC
Yong Lee, SungYoul Seo, Sungho Kang
Published in 2013 International SoC Design Conference (ISOCC) (01.11.2013)
Published in 2013 International SoC Design Conference (ISOCC) (01.11.2013)
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Conference Proceeding
2-D Failure Bitmap Compression Using Line Fault Marking Method
Cho, Keewon, Lee, Young-woo, Seo, Sungyoul, Kang, Sungho
Published in 2018 International SoC Design Conference (ISOCC) (01.11.2018)
Published in 2018 International SoC Design Conference (ISOCC) (01.11.2018)
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Conference Proceeding
An efficient built-in self-repair scheme for area reduction
Cho, Keewon, Lee, Young-woo, Seo, Sungyoul, Kang, Sungho
Published in 2017 International SoC Design Conference (ISOCC) (01.11.2017)
Published in 2017 International SoC Design Conference (ISOCC) (01.11.2017)
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Conference Proceeding