Radiation-induced soft error rate analyses for 14 nm FinFET SRAM devices
Soonyoung Lee, Ilgon Kim, Sungmock Ha, Cheong-sik Yu, Jinhyun Noh, Sangwoo Pae, Jongwoo Park
Published in 2015 IEEE International Reliability Physics Symposium (01.04.2015)
Published in 2015 IEEE International Reliability Physics Symposium (01.04.2015)
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Conference Proceeding
Experimental study on BTI variation impacts in SRAM based on high-k/metal gate FinFET: From transistor level Vth mismatch, cell level SNM to product level Vmin
Liu, Changze, Nam, Hyeonwoo, Kim, Kangjung, Choo, Seungjin, Kim, Hyejin, Kim, Hyunjin, Kim, Yoohwan, Lee, Soonyoung, Yoon, Sungyoung, Kim, Jungin, Kim, Jin Ju, Hwang, Lira, Ha, Sungmock, Jin, Min-Jung, Sagong, Hyun Chul, Park, June-Kyun, Pae, Sangwoo, Park, Jongwoo
Published in 2015 IEEE International Electron Devices Meeting (IEDM) (01.12.2015)
Published in 2015 IEEE International Electron Devices Meeting (IEDM) (01.12.2015)
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Conference Proceeding
Journal Article
Reliability Characterization of HBM featuring \text+\text Logic Chip with Multi-stacked DRAMs
Ha, Sungmock, Lee, S., Bae, GH, Lee, DS, Kim, S.H., Woo, BW, Lee, N-H, Lee, YS, Pae, S.
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
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Conference Proceeding