ZnO composite nanolayer with mobility edge quantization for multi-value logic transistors
Lee, Lynn, Hwang, Jeongwoon, Jung, Jin Won, Kim, Jongchan, Lee, Ho-In, Heo, Sunwoo, Yoon, Minho, Choi, Sungju, Van Long, Nguyen, Park, Jinseon, Jeong, Jae Won, Kim, Jiyoung, Kim, Kyung Rok, Kim, Dae Hwan, Im, Seongil, Lee, Byoung Hun, Cho, Kyeongjae, Sung, Myung Mo
Published in Nature communications (30.04.2019)
Published in Nature communications (30.04.2019)
Get full text
Journal Article
Systematic Decomposition of the Positive Bias Stress Instability in Self-Aligned Coplanar InGaZnO Thin-Film Transistors
Sungju Choi, Juntae Jang, Hara Kang, Ju Heyuck Baeck, Jong Uk Bae, Kwon-Shik Park, Soo Young Yoon, In Byeong Kang, Dong Myong Kim, Sung-Jin Choi, Yong-Sung Kim, Oh, Saeroonter, Dae Hwan Kim
Published in IEEE electron device letters (01.05.2017)
Published in IEEE electron device letters (01.05.2017)
Get full text
Journal Article
Ultrasensitive Electrical Detection of Hemagglutinin for Point-of-Care Detection of Influenza Virus Based on a CMP-NANA Probe and Top-Down Processed Silicon Nanowire Field-Effect Transistors
Uhm, Mihee, Lee, Jin-Moo, Lee, Jieun, Lee, Jung Han, Choi, Sungju, Park, Byung-Gook, Kim, Dong Myong, Choi, Sung-Jin, Mo, Hyun-Sun, Jeong, Yong-Joo, Kim, Dae Hwan
Published in Sensors (Basel, Switzerland) (17.10.2019)
Published in Sensors (Basel, Switzerland) (17.10.2019)
Get full text
Journal Article
Unscrambling for Subgap Density-of-States in Multilayered MoS2 Field Effect Transistors under DC Bias Stress via Optical Charge-Pumping Capacitance-Voltage Spectroscopy
Yang, Ga Won, Seo, Seung Gi, Choi, Sungju, Kim, Dae Hwan, Jin, Sung Hun
Published in IEEE access (2021)
Published in IEEE access (2021)
Get full text
Journal Article
Effect of Simultaneous Mechanical and Electrical Stress on the Electrical Performance of Flexible In-Ga-Zn-O Thin-Film Transistors
Seo, Youngjin, Jeong, Hwan-Seok, Jeong, Ha-Yun, Park, Shinyoung, Jang, Jun Tae, Choi, Sungju, Kim, Dong Myong, Choi, Sung-Jin, Jin, Xiaoshi, Kwon, Hyuck-In, Kim, Dae Hwan
Published in Materials (04.10.2019)
Published in Materials (04.10.2019)
Get full text
Journal Article
Experimental extraction of stern-layer capacitance in biosensor detection using silicon nanowire field-effect transistors
Choi, Sungju, Mo, Hyun-Sun, Kim, Jungmok, Kim, Seohyeon, Lee, Seung Min, Choi, Sung-Jin, Kim, Dong Myong, Park, Dong-Wook, Kim, Dae Hwan
Published in Current applied physics (01.06.2020)
Published in Current applied physics (01.06.2020)
Get full text
Journal Article
The Effect of Gate and Drain Fields on the Competition Between Donor-Like State Creation and Local Electron Trapping in In-Ga-Zn-O Thin Film Transistors Under Current Stress
Sungju Choi, Hyeongjung Kim, Chunhyung Jo, Hyun-Suk Kim, Sung-Jin Choi, Dong Myong Kim, Park, Jozeph, Dae Hwan Kim
Published in IEEE electron device letters (01.12.2015)
Published in IEEE electron device letters (01.12.2015)
Get full text
Journal Article
Modeling and Characterization of the Abnormal Hump in n-Channel Amorphous-InGaZnO Thin-Film Transistors After High Positive Bias Stress
Lee, Jungmin, Choi, Sungju, Kim, Seong Kwang, Choi, Sung-Jin, Kim, Dae Hwan, Park, Jisun, Kim, Dong Myong
Published in IEEE electron device letters (01.10.2015)
Published in IEEE electron device letters (01.10.2015)
Get full text
Journal Article
Current Boosting of Self‐Aligned Top‐Gate Amorphous InGaZnO Thin‐Film Transistors under Driving Conditions
Park, Jingyu, Choi, Sungju, Kim, Changwook, Shin, Hong Jae, Jeong, Yun Sik, Bae, Jong Uk, Oh, Chang Ho, Oh, Saeroonter, Kim, Dae Hwan
Published in Advanced electronic materials (01.03.2023)
Published in Advanced electronic materials (01.03.2023)
Get full text
Journal Article
Band-Bending Effect in the Characterization of Subgap Density-of-States in Amorphous TFTs Through Fully Electrical Techniques
Lee, Heesung, Kim, Jaewon, Choi, Sungju, Kim, Seong Kwang, Kim, Junyeap, Park, Jaewon, Choi, Sung-Jin, Kim, Dae Hwan, Kim, Dong Myong
Published in IEEE electron device letters (01.02.2017)
Published in IEEE electron device letters (01.02.2017)
Get full text
Journal Article
A Study on the Degradation of In-Ga-Zn-O Thin-Film Transistors Under Current Stress by Local Variations in Density of States and Trapped Charge Distribution
Sungju Choi, Hyeongjung Kim, Chunhyung Jo, Hyun-Suk Kim, Sung-Jin Choi, Dong Myong Kim, Park, Jozeph, Dae Hwan Kim
Published in IEEE electron device letters (01.07.2015)
Published in IEEE electron device letters (01.07.2015)
Get full text
Journal Article
Analysis of Instability Mechanism under Simultaneous Positive Gate and Drain Bias Stress in Self-Aligned Top-Gate Amorphous Indium-Zinc-Oxide Thin-Film Transistors
Kim, Jonghwa, Choi, Sungju, Jang, Jaeman, Jang, Jun Tae, Kim, Jungmok, Choi, Sung-Jin, Kim, Dong Myong, Kim, Dae Hwan
Published in Journal of semiconductor technology and science (01.10.2015)
Published in Journal of semiconductor technology and science (01.10.2015)
Get full text
Journal Article
Frequency-dependent C-V Characteristic-based Extraction of Interface Trap Density in Normally-off Gate-recessed AlGaN/GaN Heterojunction Field-effect Transistors
Choi, Sungju, Kang, Youngjin, Kim, Jonghwa, Kim, Jungmok, Choi, Sung-Jin, Kim, Dong Myong, Cha, Ho-Young, Kim, Hyungtak, Kim, Dae Hwan
Published in Journal of semiconductor technology and science (01.10.2015)
Published in Journal of semiconductor technology and science (01.10.2015)
Get full text
Journal Article
Total Subgap Range Density of States-Based Analysis of the Effect of Oxygen Flow Rate on the Bias Stress Instabilities in a-IGZO TFTs
Yang, Ga Won, Park, Jingyu, Choi, Sungju, Kim, Changwook, Kim, Dong Myong, Choi, Sung-Jin, Bae, Jong-Ho, Cho, Il Hwan, Kim, Dae Hwan
Published in IEEE transactions on electron devices (01.01.2022)
Published in IEEE transactions on electron devices (01.01.2022)
Get full text
Journal Article